Use of quantitative X-ray diffraction for academic and industrial applications

被引：3

作者：

Mertens, Gilles ^{[1
]}

Zeelmaekers, Edwin ^{[1
]}

Machiels, Lieven ^{[1
]}

机构：

[1] KULeuven, Dept Geol, Leuven, Belgium

来源：

ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2006年 / 62卷

关键词：

quantitative X-ray powder diffraction; powder diffraction software; mineralogy;

D O I：

10.1107/S010876730609581X

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

m22.p07

引用

页码：S209 / S209

页数：1

共 50 条

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