Study and modeling of the Solid Electrolyte Interphase behavior on nano-silicon anodes by Electrochemical Impedance Spectroscopy

被引:70
作者
Radvanyi, Etienne [1 ]
Van Havenbergh, Kristof [2 ,3 ]
Porcher, Willy [1 ]
Jouanneau, Severine [1 ]
Bridel, Jean-Sebastien [2 ]
Put, Stijn [2 ]
Franger, Sylvain [4 ]
机构
[1] Lab Innovat New Energy Technol & Nanomat LITEN, French Commissary Atom & Alternat Energies CEA, F-38054 Grenoble 9, France
[2] Umicore Res, B-2250 Olen, Belgium
[3] Univ Antwerp, EMAT, B-2020 Antwerp, Belgium
[4] Univ Paris 11, ICMMO ERIEE, CNRS, UMR 8182, F-91405 Orsay, France
关键词
Lithium batteries; nano-silicon; SEI; impedance spectroscopy; modeling; LITHIUM-ION BATTERIES; SI NEGATIVE ELECTRODES; IN-SITU; AMORPHOUS-SILICON; SURFACE-CHEMISTRY; 1ST LITHIATION; LI; PERFORMANCE; GRAPHITE; INSERTION/EXTRACTION;
D O I
10.1016/j.electacta.2014.06.069
中图分类号
O646 [电化学、电解、磁化学];
学科分类号
081704 ;
摘要
The instability of the Solid Electrolyte Interphase (SEI) at the surface of nano-silicon electrodes has been recognized as one of the key issues to explain the rapid capacity fading of theses electrodes. In this paper, two distinct Si-based systems are studied by using Electrochemical Impedance Spectroscopy (EIS). First, several EIS spectra are recorded along the second electrochemical cycle. Although the active material, the electrode formulation, and the experimental conditions are different for the two systems, the same phenomena are observed in both cases: (i) the SEI deposit around 50 kHz, (ii) the charge transfer (CT) with a characteristic frequency varying from 300 to 1 500 Hz, and (iii) an inductive loop at similar to 1 Hz which appears only when the potential of the electrode is below 0.35 V vs Li. As the latter has never been reported for Si-based electrodes, the second step of the work consists in understanding this phenomenon. Thanks to the results obtained in a set of several complementary experiments, we finally attribute the inductive loop to the constant formation/deposition of SEI products, in competition with the CT process. In addition, we propose a mechanism for this specific phenomenon and the equivalent circuit to fit the recorded EIS spectra. (C) 2014 Elsevier Ltd. All rights reserved.
引用
收藏
页码:751 / 757
页数:7
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