Solving to Optimality a Discrete Lot-Sizing Problem Thanks to Multi-product Multi-period Valid Inequalities
被引:0
|
作者:
Gicquel, Celine
论文数: 0引用数: 0
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机构:
Univ Paris 11, Rech Informat Lab, F-91400 Orsay, France
Univ Paris 06, Lab Informat Paris 6, F-75005 Paris, FranceUniv Paris 11, Rech Informat Lab, F-91400 Orsay, France
Gicquel, Celine
[1
,2
]
Minoux, Michel
论文数: 0引用数: 0
h-index: 0
机构:
Univ Paris 11, Rech Informat Lab, F-91400 Orsay, France
Univ Paris 06, Lab Informat Paris 6, F-75005 Paris, FranceUniv Paris 11, Rech Informat Lab, F-91400 Orsay, France
Minoux, Michel
[1
,2
]
机构:
[1] Univ Paris 11, Rech Informat Lab, F-91400 Orsay, France
[2] Univ Paris 06, Lab Informat Paris 6, F-75005 Paris, France
来源:
OPERATIONS RESEARCH AND ENTERPRISE SYSTEMS, ICORES 2014
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2015年
/
509卷
关键词:
Production planning;
Lot-sizing;
Mixed-integer linear programming;
Valid inequalities;
Cutting-plane algorithm;
SCHEDULING PROBLEM;
D O I:
10.1007/978-3-319-17509-6_16
中图分类号:
TP39 [计算机的应用];
学科分类号:
081203 ;
0835 ;
摘要:
We consider a problem related to industrial production planning, namely the multi-product discrete lot-sizing and scheduling problem with sequence-dependent changeover costs. This combinatorial optimization is formulated as a mixed-integer linear program and solved to optimality by using a standard Branch & Bound procedure. However, the computational efficiency of such a solution approach relies heavily on the quality of the bounds used at each node of the Branch & Bound search tree. To improve the quality of these bounds, we propose a new family of multi-product multi-period valid inequalities and present both an exact and a heuristic separation algorithm which form the basis of a cutting-plane generation algorithm. We finally discuss preliminary computational results which confirm the practical usefulness of the proposed valid inequalities at strengthening the MILP formulation and at reducing the overall computation time.
机构:
Virginia Tech, Dept Ind & Syst Engn, 250 Durham Hall,1145 Perry St, Blacksburg, VA 24060 USAVirginia Tech, Dept Ind & Syst Engn, 250 Durham Hall,1145 Perry St, Blacksburg, VA 24060 USA
Kulkarni, Kartik
Bansal, Manish
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机构:
Virginia Tech, Dept Ind & Syst Engn, 250 Durham Hall,1145 Perry St, Blacksburg, VA 24060 USAVirginia Tech, Dept Ind & Syst Engn, 250 Durham Hall,1145 Perry St, Blacksburg, VA 24060 USA
机构:
Curtin Univ Technol, Dept Math & Stat, Western Australian Ctr Excellence Ind Optimizat, Perth, WA 6845, AustraliaCurtin Univ Technol, Dept Math & Stat, Western Australian Ctr Excellence Ind Optimizat, Perth, WA 6845, Australia
Caccetta, Louis
Mardaneh, Elham
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h-index: 0
机构:
Curtin Univ Technol, Dept Math & Stat, Western Australian Ctr Excellence Ind Optimizat, Perth, WA 6845, AustraliaCurtin Univ Technol, Dept Math & Stat, Western Australian Ctr Excellence Ind Optimizat, Perth, WA 6845, Australia