Dose Rate and Bias Effects on COTS Array CCDs Induce Dark Signals Increase

被引:2
作者
Wang Zujun [1 ]
He Baoping [1 ]
Yao Zhibin [1 ]
Liu Minbo [1 ]
Sheng Jiangkun [1 ]
机构
[1] Northwest Inst Nucl Technol, State Key Lab Intense Pulsed Radiat Simulat & Eff, Xian 710024, Shaanxi Provinc, Peoples R China
基金
美国国家科学基金会;
关键词
Array charge-coupled devices (CCDs); dark signal; dose rate; total dose; RADIATION; DEVICES; DAMAGE;
D O I
10.1109/TNS.2014.2302038
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The experiments of dose rate and bias effects on commercial-off-the-shelf array charge-coupled devices (CCDs) are presented. The dark signal (V-D) is calculated with the output signal voltages measured at different integration times when no light is incident on the CCDs. The dark signal voltages (V-D) versus the total dose at the dose rates of 0.01, 0.1, 1.0, 10.0, and 50 rad(Si)/s are compared. Annealing tests are performed to eliminate the time-dependent effects. Degradation levels were found to depend on the dose rates. The CCDs are divided into two groups-with one group biased and the other unbiased during Co-60 gamma irradiation. The biased CCDs are shown to degrade more severely than the unbiased CCDs.
引用
收藏
页码:1376 / 1380
页数:5
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