Continuous rotation electron diffraction: an approach for better understanding of beam sensitive materials

被引：0
|
作者：
Huang, Zhehao [1 ]
Zou, Xiaodong [1 ]
机构：
[1] Stockholm Univ, Dept Mat & Environm Chem, Stockholm, Sweden
来源：
ACTA CRYSTALLOGRAPHICA A-FOUNDATION AND ADVANCES | 2018年 / 74卷
关键词：
electron crystallography; metal-organic framework; beam sensitive materials;
D O I：
10.1107/S205327331809054X
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
MS23-P01
引用
收藏
页码：E307 / E307
页数：1
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