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Infrared and Raman study of two-level systems in fiber optic quality a-SiO2 and a-SiO2:GeO2
被引:3
作者:
Hubbard, BE
Agladze, NI
Tu, JJ
Sievers, AJ
机构:
[1] Cornell Univ, Atom & Solid State Phys Lab, LASSP, Ithaca, NY 14853 USA
[2] Cornell Univ, Cornell Ctr Mat Res, LASSP, Ithaca, NY 14853 USA
关键词:
two-level systems;
silica;
Raman spectroscopy;
far-infrared spectroscopy;
D O I:
10.1016/S0921-4526(02)00563-X
中图分类号:
O469 [凝聚态物理学];
学科分类号:
070205 ;
摘要:
With Raman scattering and far-infrared absorption spectroscopies two-level systems (TLS) have been examined in a series of fiber optic quality (SiO2)(1-x)(GeO2)(x) glasses. Even with large isovalent GeO2 doping, no Raman-active TLS spectrum is observed. When examined with the more sensitive far-infrared absorption technique some samples show a very weak TLS signature, but there is no correlation with the strength of the doping. It is found those internal strains in some glass samples account for this far-infrared activity. (C) 2002 Elsevier Science B.V. All rights reserved.
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页码:531 / 534
页数:4
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