Software app development to determine optical constants in non-homogeneous semiconductor thin films

This work introduces the design and development of a useful software app for studying the optical properties of semiconductor materials; thus, it is possible to know if the deposited non-homogeneous semiconductor thin films are suitable for the fabrication of semiconductor devices. Using the developed algorithm, which is based on Swanepoel's methods, it is possible to estimate optical constants of non-homogeneous semiconductor films such as: absorption coefficient ( a), refractive index (n) and band gap (Eg). In addition, the variation of the thickness in them is estimated. The input information for this tool corresponds to the spectral transmittance curves from experimental procedures. The proposed tool was found to offer high accuracy and therefore it can be used to study the properties of semiconductor thin films used in semiconductor manufacturing in a variety of applications, including clean and renewable energies such as solar cells.