Combining XRD and EXAFS with on-line catalytic studies for in situ characterization of catalysts

被引：145

作者：

Grunwaldt, JD ^{[1
]}

Clausen, BS ^{[1
]}

机构：

[1] Haldor Topsoe Res Labs, DK-2800 Lyngby, Denmark

来源：

TOPICS IN CATALYSIS | 2002年 / 18卷 / 1-2期

关键词：

EXAFS; XRD; in situ; time-resolution; copper; methanol synthesis; rhodium; catalytic partial oxidation; high temperature shift catalyst; promoter; fluorescence XAFS; piezo XAFS;

D O I：

10.1023/A:1013838428305

中图分类号：

O69 [应用化学];

学科分类号：

081704 ;

摘要：

Advances in the study of catalysts by in situ structural characterization, using X-ray absorption spectroscopy (XAFS) and X-ray diffraction (XRD), have recently been achieved and they are illustrated by reference to several examples. Emphasis in the present overview is laid on the study of catalysts under realistic working conditions and therefore in particular on-Line gas analysis during activation and/or during catalysis. The examples encompass (a) activation of copper-based methanol catalysts, (b) dynamic changes of copper-based catalysts during methanol synthesis conditions, (c) catalytic partial oxidation on Rh/Al2O3 catalysts, and (d) reduction (activation) of copper-promoted high temperature shift catalysts.

引用

页码：37 / 43

页数：7

共 61 条

[1] QEXAFS IN SECONDS AT AN UNDULATOR SOURCE [J].