Recombination mechanisms and thermal droop in AlGaN-based UV-B LEDs

被引:37
作者
De Santi, Carlo [1 ]
Meneghini, Matteo [1 ]
Monti, Desiree [1 ]
Glaab, Johannes [2 ]
Guttmann, Martin [3 ]
Rass, Jens [2 ]
Einfeldt, Sven [2 ]
Mehnke, Frank [3 ]
Enslin, Johannes [3 ]
Wernicke, Tim [3 ]
Kneissl, Michael [2 ,3 ]
Meneghesso, Gaudenzio [1 ]
Zanoni, Enrico [1 ]
机构
[1] Univ Padua, Dept Informat Engn, Via Gradenigo 6-B, I-35131 Padua, Italy
[2] Leibniz Inst Hochstfrequenztech, Ferdinand Braun Inst, Gustav Kirchhoff Str 4, D-12489 Berlin, Germany
[3] Tech Univ Berlin, Inst Festkorperphys, Hardenbergstr 36,EW 6-1, D-10623 Berlin, Germany
关键词
LIGHT-EMITTING-DIODES; EXCITON LOCALIZATION; EMISSION; PHOTOLUMINESCENCE; ELECTROLUMINESCENCE; RADIATION; DEFECTS;
D O I
10.1364/PRJ.5.000A44
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
This paper reports a comprehensive analysis of the origin of the electroluminescence (EL) peaks and of the thermal droop in UV-B AlGaN-based LEDs. By carrying out spectral measurements at several temperatures and currents, (i) we extract information on the physical origin of the various spectral bands, and (ii) we develop a novel closed-form model based on the Shockley-Read-Hall theory and on the ABC rate equation that is able to reproduce the experimental data on thermal droop caused by non-radiative recombination through deep levels. In the samples under test, the three EL bands are ascribed to the following processes: band-to-band recombination in the quantum wells (main EL peak), a parasitic intra-bandgap radiative transition in the quantum well barriers, and a second defect-related radiative process in the p-AlGaN superlattice. (C) 2017 Chinese Laser Press
引用
收藏
页码:A44 / A51
页数:8
相关论文
共 60 条
  • [1] AlGaN single-quantum-well light-emitting diodes with emission at 285 nm
    Adivarahan, V
    Wu, S
    Chitnis, A
    Pachipulusu, R
    Mandavilli, V
    Shatalov, M
    Zhang, JP
    Khan, MA
    Tamulaitis, G
    Sereika, A
    Yilmaz, I
    Shur, MS
    Gaska, R
    [J]. APPLIED PHYSICS LETTERS, 2002, 81 (19) : 3666 - 3668
  • [2] [Anonymous], SIM AR BAS SOFTW PAC
  • [3] Electrical characterisation of hole traps in n-type GaN
    Auret, FD
    Meyer, WE
    Wu, L
    Hayes, M
    Legodi, MJ
    Beaumont, B
    Gibart, P
    [J]. PHYSICA STATUS SOLIDI A-APPLIED RESEARCH, 2004, 201 (10): : 2271 - 2276
  • [4] Superluminescent light emitting diodes on naturally survived InGaN/GaN lateral nanowires
    Banerjee, D.
    Sankaranarayanan, S.
    Khachariya, D.
    Nadar, M. B.
    Ganguly, S.
    Saha, D.
    [J]. APPLIED PHYSICS LETTERS, 2016, 109 (03)
  • [5] THERMAL DISSOCIATION OF EXCITONS BOUNDS TO NEUTRAL ACCEPTORS IN HIGH-PURITY GAAS
    BIMBERG, D
    SONDERGELD, M
    GROBE, E
    [J]. PHYSICAL REVIEW B-SOLID STATE, 1971, 4 (10): : 3451 - +
  • [6] Polar and semipolar GaN/Al0.5Ga0.5N nanostructures for UV light emitters
    Brault, J.
    Rosales, D.
    Damilano, B.
    Leroux, M.
    Courville, A.
    Korytov, M.
    Chenot, S.
    Vennegues, P.
    Vinter, B.
    De Mierry, P.
    Kahouli, A.
    Massies, J.
    Bretagnon, T.
    Gil, B.
    [J]. SEMICONDUCTOR SCIENCE AND TECHNOLOGY, 2014, 29 (08)
  • [7] Active region dimensionality and quantum efficiencies of InGaN LEDs from temperature dependent photoluminescence transients
    Can, Nuri
    Okur, Serdal
    Monavarian, Morteza
    Zhang, Fan
    Avrutin, Vitaliy
    Morkoc, Hadis
    Teke, Ali
    Ozgur, Umit
    [J]. GALLIUM NITRIDE MATERIALS AND DEVICES X, 2015, 9363
  • [8] Temperature-dependent electroluminescence of AlGaN-based UV LEDs
    Cao, XA
    LeBoeuf, SF
    Stecher, TE
    [J]. IEEE ELECTRON DEVICE LETTERS, 2006, 27 (05) : 329 - 331
  • [9] Temperature-dependent emission intensity and energy shift in InGaN/GaN multiple-quantum-well light-emitting diodes
    Cao, XA
    LeBoeuf, SF
    Rowland, LB
    Yan, CH
    Liu, H
    [J]. APPLIED PHYSICS LETTERS, 2003, 82 (21) : 3614 - 3616
  • [10] Dynamics of GaN band edge photoluminescence at near-room-temperature regime
    Chen, XB
    Huso, J
    Morrison, JL
    Bergman, L
    [J]. JOURNAL OF APPLIED PHYSICS, 2006, 99 (04)