Recombination mechanisms and thermal droop in AlGaN-based UV-B LEDs

被引:40
作者
De Santi, Carlo [1 ]
Meneghini, Matteo [1 ]
Monti, Desiree [1 ]
Glaab, Johannes [2 ]
Guttmann, Martin [3 ]
Rass, Jens [2 ]
Einfeldt, Sven [2 ]
Mehnke, Frank [3 ]
Enslin, Johannes [3 ]
Wernicke, Tim [3 ]
Kneissl, Michael [2 ,3 ]
Meneghesso, Gaudenzio [1 ]
Zanoni, Enrico [1 ]
机构
[1] Univ Padua, Dept Informat Engn, Via Gradenigo 6-B, I-35131 Padua, Italy
[2] Leibniz Inst Hochstfrequenztech, Ferdinand Braun Inst, Gustav Kirchhoff Str 4, D-12489 Berlin, Germany
[3] Tech Univ Berlin, Inst Festkorperphys, Hardenbergstr 36,EW 6-1, D-10623 Berlin, Germany
关键词
LIGHT-EMITTING-DIODES; EXCITON LOCALIZATION; EMISSION; PHOTOLUMINESCENCE; ELECTROLUMINESCENCE; RADIATION; DEFECTS;
D O I
10.1364/PRJ.5.000A44
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
This paper reports a comprehensive analysis of the origin of the electroluminescence (EL) peaks and of the thermal droop in UV-B AlGaN-based LEDs. By carrying out spectral measurements at several temperatures and currents, (i) we extract information on the physical origin of the various spectral bands, and (ii) we develop a novel closed-form model based on the Shockley-Read-Hall theory and on the ABC rate equation that is able to reproduce the experimental data on thermal droop caused by non-radiative recombination through deep levels. In the samples under test, the three EL bands are ascribed to the following processes: band-to-band recombination in the quantum wells (main EL peak), a parasitic intra-bandgap radiative transition in the quantum well barriers, and a second defect-related radiative process in the p-AlGaN superlattice. (C) 2017 Chinese Laser Press
引用
收藏
页码:A44 / A51
页数:8
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