SnAgCu: Microstructural evolution and mechanical properties

被引:0
作者
Fouassier, O [1 ]
Chazelas, J [1 ]
Silvain, JF [1 ]
机构
[1] CNRS, ICMCB, F-33608 Pessac, France
来源
PRICM 4: FORTH PACIFIC RIM INTERNATIONAL CONFERENCE ON ADVANCED MATERIALS AND PROCESSING, VOLS I AND II | 2001年
关键词
lead-free solder; tin-silver-copper alloy; mechanical characterization; transmission electron microscopy; interfacial study;
D O I
暂无
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The fact that the great majority of the solder pastes contain lead is an environmental threat. In order to eliminate this undesirable environmental impact associated with their production, a new family of lead free solder joint, Sn-3.8Ag-0.7Cu, is proposed. Microstructural and mechanical data of this new solder joint have been acquired and compared with the most common used SnPbAg solder paste. Consequently the purpose of this paper is to understand the evolution of the microstructure, failure mode and mechanical properties of SnAgCu solder joint with stain rate, annealing treatments and testing temperature. Tensile tests, at temperature ranging from -50 to +150degreesC, have been performed on bulk samples. TEM investigations have shown that microstructural changes are correlated with the modification of the mechanical properties of bulk tested samples.
引用
收藏
页码:1039 / 1042
页数:4
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