Impedance diagnosis of metal-supported SOFCs with SDC as electrolyte
被引:42
作者:
Huang, Qiu-An
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Hubei Univ, Fac Phys & Elect Technol, Wuhan 430062, Hubei, Peoples R China
Huazhong Univ Sci & Technol, Dept Control Sci & Engn, Wuhan 430074, Peoples R ChinaNatl Res Council Canada, Inst Fuel Cell Innovat, Vancouver, BC V6T 1W5, Canada
Huang, Qiu-An
[2
,3
]
Wang, Bingwen
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Huazhong Univ Sci & Technol, Dept Control Sci & Engn, Wuhan 430074, Peoples R ChinaNatl Res Council Canada, Inst Fuel Cell Innovat, Vancouver, BC V6T 1W5, Canada
Wang, Bingwen
[3
]
Qu, Wei
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Natl Res Council Canada, Inst Fuel Cell Innovat, Vancouver, BC V6T 1W5, CanadaNatl Res Council Canada, Inst Fuel Cell Innovat, Vancouver, BC V6T 1W5, Canada
Qu, Wei
[1
]
Hui, Rob
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Natl Res Council Canada, Inst Fuel Cell Innovat, Vancouver, BC V6T 1W5, CanadaNatl Res Council Canada, Inst Fuel Cell Innovat, Vancouver, BC V6T 1W5, Canada
Hui, Rob
[1
]
机构:
[1] Natl Res Council Canada, Inst Fuel Cell Innovat, Vancouver, BC V6T 1W5, Canada
[2] Hubei Univ, Fac Phys & Elect Technol, Wuhan 430062, Hubei, Peoples R China
[3] Huazhong Univ Sci & Technol, Dept Control Sci & Engn, Wuhan 430074, Peoples R China
Degradation mechanism of the metal-supported SOFCs with NiO-Ce0.8Sm0.2O2 delta(NiO-SDC) as anode, SDC as electrolyte, Sm0.5S0.5CoO3 (SSCo)-SDC composite as cathode was addressed with an emphasis oil metal oxidation and thermal expansion mismatch. The diagnosis was based on an improved equivalent circuit model combined with impedance, microstructure and composition analysis of the cell and cell components. The impedance diagnosis indicates that the high contact resistance is a prominent factor impeding the performance of metal-supported SOFCs at 450-600 degrees C. The observed oxide scale at the interface between metallic substrate and anode, and, the weak bonding between the electrolyte and the cathode may be responsible for the high contact resistances. Energy-dispersive X-ray spectroscopy (EDX) was applied to analyze the change of surface composition of metallic substrate joined with anode in order to elucidate the formed oxide scale. In addition, based on the improved equivalent circuit model, internal shorting current of the cell due to electronic conduction was evaluated. Crown Copyright (C) 2009 Published by Elsevier B.V. All rights reserved.
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Univ Calif Berkeley, Lawrence Berkeley Lab, Div Mat Sci, Berkeley, CA 94720 USAUniv Calif Berkeley, Lawrence Berkeley Lab, Div Mat Sci, Berkeley, CA 94720 USA
Tucker, Michael C.
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Lau, Grace Y.
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Univ Calif Berkeley, Lawrence Berkeley Lab, Div Mat Sci, Berkeley, CA 94720 USAUniv Calif Berkeley, Lawrence Berkeley Lab, Div Mat Sci, Berkeley, CA 94720 USA
Lau, Grace Y.
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Jacobson, Craig P.
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Univ Calif Berkeley, Lawrence Berkeley Lab, Div Mat Sci, Berkeley, CA 94720 USAUniv Calif Berkeley, Lawrence Berkeley Lab, Div Mat Sci, Berkeley, CA 94720 USA
Jacobson, Craig P.
;
DeJonghe, Lutgard C.
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Univ Calif Berkeley, Lawrence Berkeley Lab, Div Mat Sci, Berkeley, CA 94720 USAUniv Calif Berkeley, Lawrence Berkeley Lab, Div Mat Sci, Berkeley, CA 94720 USA
DeJonghe, Lutgard C.
;
Visco, Steven J.
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Univ Calif Berkeley, Lawrence Berkeley Lab, Div Mat Sci, Berkeley, CA 94720 USAUniv Calif Berkeley, Lawrence Berkeley Lab, Div Mat Sci, Berkeley, CA 94720 USA
机构:
Univ Calif Berkeley, Lawrence Berkeley Lab, Div Mat Sci, Berkeley, CA 94720 USAUniv Calif Berkeley, Lawrence Berkeley Lab, Div Mat Sci, Berkeley, CA 94720 USA
Tucker, Michael C.
;
Lau, Grace Y.
论文数: 0引用数: 0
h-index: 0
机构:
Univ Calif Berkeley, Lawrence Berkeley Lab, Div Mat Sci, Berkeley, CA 94720 USAUniv Calif Berkeley, Lawrence Berkeley Lab, Div Mat Sci, Berkeley, CA 94720 USA
Lau, Grace Y.
;
Jacobson, Craig P.
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机构:
Univ Calif Berkeley, Lawrence Berkeley Lab, Div Mat Sci, Berkeley, CA 94720 USAUniv Calif Berkeley, Lawrence Berkeley Lab, Div Mat Sci, Berkeley, CA 94720 USA
Jacobson, Craig P.
;
DeJonghe, Lutgard C.
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h-index: 0
机构:
Univ Calif Berkeley, Lawrence Berkeley Lab, Div Mat Sci, Berkeley, CA 94720 USAUniv Calif Berkeley, Lawrence Berkeley Lab, Div Mat Sci, Berkeley, CA 94720 USA
DeJonghe, Lutgard C.
;
Visco, Steven J.
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机构:
Univ Calif Berkeley, Lawrence Berkeley Lab, Div Mat Sci, Berkeley, CA 94720 USAUniv Calif Berkeley, Lawrence Berkeley Lab, Div Mat Sci, Berkeley, CA 94720 USA