Extended Characterization of the Common-Source and Common-Gate Amplifiers Using a Metal-Ferroelectric-Semiconductor Field Effect Transistor

被引:0
作者
Hunt, Mitchell R. [1 ]
Sayyah, Rana [1 ]
Mitchell, Cody [1 ]
McCartney, Crystal L. [1 ]
Macleod, Todd C. [2 ]
Ho, Fat D. [1 ]
机构
[1] Univ Alabama, Dept Elect & Comp Engn, Huntsville, AL 35899 USA
[2] NASA, Marshall Space Flight Ctr, Huntsville, AL 35812 USA
关键词
MFSFET; MFFET; metal-ferroelectric-semiconductor field effect transistor; FeFET; FFET; ferroelectric transistor; common-source amplifier; common-gate amplifier;
D O I
10.1080/10584587.2014.912082
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
Collected data for both common-source and common-gate amplifiers is presented in this paper. Characterizations of the two amplifier circuits using metal-ferroelectric-semiconductor field effect transistors (MFSFETs) are developed with wider input frequency ranges and additional device sizes compared to earlier characterizations. The effects of the ferroelectric layer's capacitance and variation of load, quiescent point, or input signal on each circuit are shown. Advantages and applications of the MFSFET and the circuit performance are discussed.
引用
收藏
页码:71 / 80
页数:10
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