New effective dielectric constant model for ultra-high speed microstrip lines on multilayer dielectric substrates: Effect of conductor-dielectric interphase

被引:5
作者
Vo, HT [1 ]
Davidson, C [1 ]
Shi, FG [1 ]
机构
[1] Univ Calif Irvine, Optoelect Packaging & Automat Lab, Henry Samueli Sch Engn, Irvine, CA 92697 USA
来源
52ND ELECTRONIC COMPONENTS & TECHNOLOGY CONFERENCE, 2002 PROCEEDINGS | 2002年
关键词
D O I
10.1109/ECTC.2002.1008077
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The existing CAD formulae are complicated and inaccurate at high frequencies. In particular, no closed-form expression has been obtained for the effective dielectric constant of microstrip lines on multi-layed dielectric substrate by considering the line-substrate interphase effect, although attempts have been made to study the finite thickness effect of the conductor and dielectric substrate. The present work represents the first attempt to obtain a closed-form CAD formula for the effective dielectric constant of microstrip lines on dielectric substrates by considering the effect of conductor-substrate interphase, in addition to the skin effect losses, dielectric loss, dispersion and radiation losses based on the quasi-TEM assumption and the superposition of partial capacitance. The model is verified by experimental observations on the effective dielectric constant and its dependence on microstrip dimension and frequency.
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页码:86 / 89
页数:2
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