Analog fault diagnosis of actual circuits using neural networks

被引:179
作者
Aminian, F [1 ]
Aminian, M [1 ]
Collins, HW [1 ]
机构
[1] St Marys Univ, Dept Engn, San Antonio, TX 78228 USA
关键词
analog circuits; electronic circuits; fault diagnosis; neural networks;
D O I
10.1109/TIM.2002.1017726
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
We have developed a neural-network based analog fault diagnostic system for actual circuits. Our system uses a data acquisition board to excite a circuit with an impulse and sample its output to collect training data for the neural network. The collected data is preprocessed by wavelet decomposition, normalization, and principal component analysis (PCA) to generate optimal features for training the neural network. This ensures a simple architecture for the neural network and minimizes the size of the training set required for its proper training. Our studies indicate that features extracted from actual circuits lie closer to each other and exhibit more overlap across fault classes compared to SPICE simulations. This implies that the neural network architecture which can most reliably perform fault diagnosis of actual circuits is one whose outputs estimate the probabilities that input features belong to different fault classes. Our work also shows that SPICE simulations can be used to select appropriate features for training the neural network. Reliable diagnosis of faults in an actual circuit, however, requires training data from the circuit itself. Our fault diagnostic system, trained and tested using data obtained from real sample circuits, achieves 95% accuracy in classifying faulty components.
引用
收藏
页码:544 / 550
页数:7
相关论文
共 13 条
  • [1] Neural-network based analog-circuit fault diagnosis using wavelet transform as preprocessor
    Aminian, M
    Aminian, F
    [J]. IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-ANALOG AND DIGITAL SIGNAL PROCESSING, 2000, 47 (02): : 151 - 156
  • [2] [Anonymous], 1991, TESTING DIAGNOSIS AN
  • [3] FAULT-DIAGNOSIS OF ANALOG CIRCUITS
    BANDLER, JW
    SALAMA, AE
    [J]. PROCEEDINGS OF THE IEEE, 1985, 73 (08) : 1279 - 1325
  • [4] Bishop C. M., 1995, NEURAL NETWORKS PATT
  • [5] Catelani M, 1998, IEEE IMTC P, P501, DOI 10.1109/IMTC.1998.679838
  • [6] Catelani M., 1996, Measurement, V17, P73, DOI 10.1016/0263-2241(96)00012-7
  • [7] Analog circuit fault diagnosis based on noise measurement
    Dai, YS
    Xu, JS
    [J]. MICROELECTRONICS RELIABILITY, 1999, 39 (08) : 1293 - 1298
  • [8] *IEEE, 1987, SEL PAP AN FAULT DIA
  • [9] RIZK MRM, 1998, NAT RAD SCI C P, V40
  • [10] SPINA R, 1997, IEEE T CIRCUITS SYST, V44