Effect of surface treatments on interfacial adhesion energy between UV-curable resist and glass wafer

被引:26
作者
Jang, Eun-Jung [2 ]
Park, Young-Bae [2 ]
Lee, Hak-Joo [1 ]
Choi, Dae-Geun [1 ]
Jeong, Jun-Ho [1 ]
Lee, Eung-Sug [1 ]
Hyun, Seungmin [1 ]
机构
[1] Korea Inst Machinery & Mat, Div Nano Mech Syst Res, Taejon 305343, South Korea
[2] Andong Natl Univ, Sch Mat Sci & Engn, Andong 760749, South Korea
基金
新加坡国家研究基金会;
关键词
Nanoimprint-lithography; Self-assembled monolayer; Surface treatment; Interfacial adhesion energy; NANOIMPRINT; LITHOGRAPHY; IMPRINT;
D O I
10.1016/j.ijadhadh.2009.02.006
中图分类号
TQ [化学工业];
学科分类号
0817 ;
摘要
The interfacial adhesion energy between the resist and the substrate is very important in nanoimprinting because of problems with the resist sticking or pulling off during separation of the mold from the substrate. Substrate surface treatments with a self-assembled monolayer or oxygen plasma provide good adhesion between a resist coating and a silica substrate. In this paper, we describe the adhesion properties of a resist and a glass wafer measured using the four-point bending test. The interfacial adhesion energy between the resist and the glass wafer was evaluated for various substrate surface treatments of adhesion promoters and anti-sticking layers. The interfacial fracture energy without treatment was 1.23 J/m(2). and was in the range 0.49-2.57 J/m(2) for the other treatments tested. The interfacial fracture surfaces were also investigated by field emission scanning electron microscopy, energy dispersive spectroscopy, and X-ray photoelectron spectroscopy to determine the fracture mode at the interfaces. (C) 2009 Elsevier Ltd. All rights reserved.
引用
收藏
页码:662 / 669
页数:8
相关论文
共 16 条
[1]   A test specimen for determining the fracture resistarim of bimaterial interfaces [J].
Charalambides, PG ;
Lund, J ;
Evans, AG ;
McMeeking, RM .
JOURNAL OF APPLIED MECHANICS-TRANSACTIONS OF THE ASME, 1989, 56 (01) :77-82
[2]   Fluorinated organic-inorganic hybrid mold as a new stamp for nanoimprint and soft lithography [J].
Choi, DG ;
Jeong, JH ;
Sim, YS ;
Lee, ES ;
Kim, WS ;
Bae, BS .
LANGMUIR, 2005, 21 (21) :9390-9392
[3]  
CHOI DG, 2008, J NANOSCI N IN PRESS, V8
[4]   IMPRINT OF SUB-25 NM VIAS AND TRENCHES IN POLYMERS [J].
CHOU, SY ;
KRAUSS, PR ;
RENSTROM, PJ .
APPLIED PHYSICS LETTERS, 1995, 67 (21) :3114-3116
[5]  
CU Q, 2007, APPL SURF SCI, V253, P6800
[6]   Adhesion between template materials and UV-cured nanoimprint resists [J].
Houle, F. A. ;
Guyer, Eric ;
Miller, D. C. ;
Dauskardt, Reinhold .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 2007, 25 (04) :1179-1185
[7]   Analyses of mechanical failure in nanoimprint processes [J].
Hsueh, Chun-Hway ;
Lee, Sanboh ;
Lin, Hung-Yi ;
Chen, Lai-Sheng ;
Wang, Wei-Han .
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, 2006, 433 (1-2) :316-322
[8]   Initiation and arrest of an interfacial crack in a four-point bend test [J].
Huang, ZY ;
Suo, Z ;
Xu, GH ;
He, J ;
Prévost, JH ;
Sukumar, N .
ENGINEERING FRACTURE MECHANICS, 2005, 72 (17) :2584-2601
[9]   Four-point bend adhesion measurements of copper and permalloy systems [J].
Hughey, MP ;
Morris, DJ ;
Cook, RF ;
Bozeman, SP ;
Kelly, BL ;
Chakravarty, SLN ;
Harkens, DP ;
Stearns, LC .
ENGINEERING FRACTURE MECHANICS, 2004, 71 (02) :245-261
[10]   Influence of process parameters on ethylene-norbornene copolymers made by using [2,2′-methylenebis(1,3-dimethyleyclopentadienyl)]-zirconium dichloride and MAO [J].
Jeong, BG ;
Nam, DW ;
Hong, SD ;
Lee, SG ;
Park, YW ;
Song, KH .
KOREAN JOURNAL OF CHEMICAL ENGINEERING, 2003, 20 (01) :22-26