A "Nanoprism" Probe for Nano-optical Applications

被引：10
作者：
Kim, Toekyeong [1 ]
Kim, Deok-Soo [2 ]
Lee, Byung Yong [1 ]
Kim, Zee Hwon [2 ]
Hong, Seunghun [1 ]
机构：
[1] Seoul Natl Univ, Dept Phys & Astron, Seoul 151747, South Korea
[2] Korea Univ, Dept Chem, Seoul 136701, South Korea
来源：
ADVANCED MATERIALS | 2009年 / 21卷 / 12期
关键词：
ATOMIC-FORCE MICROSCOPY; FIELD; RESOLUTION; NANOPARTICLE; NANOWIRES; BEAM; TIPS;
D O I：
10.1002/adma.200801528
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
"Nanoprism" probes are fabricated for nano-optical applications. The fabrication process is scalable for mass-production, and can be used to prepare nanoprobes terminated with virtually any nanostructure, such as nanoprisms, ZnO nanorods, and nanoparticles. ANSOM imaging was performed on a nanoparticle using Au-nanoprism probes, revealing field localization at the vertices of the nanoprism.
引用
收藏
页码：1238 / +
页数：6
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