A "Nanoprism" Probe for Nano-optical Applications

被引：10

作者：

Kim, Toekyeong ^{[1
]}

Kim, Deok-Soo ^{[2
]}

Lee, Byung Yong ^{[1
]}

Kim, Zee Hwon ^{[2
]}

Hong, Seunghun ^{[1
]}

机构：

[1] Seoul Natl Univ, Dept Phys & Astron, Seoul 151747, South Korea

[2] Korea Univ, Dept Chem, Seoul 136701, South Korea

来源：

ADVANCED MATERIALS | 2009年 / 21卷 / 12期

关键词：

ATOMIC-FORCE MICROSCOPY; FIELD; RESOLUTION; NANOPARTICLE; NANOWIRES; BEAM; TIPS;

D O I：

10.1002/adma.200801528

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

"Nanoprism" probes are fabricated for nano-optical applications. The fabrication process is scalable for mass-production, and can be used to prepare nanoprobes terminated with virtually any nanostructure, such as nanoprisms, ZnO nanorods, and nanoparticles. ANSOM imaging was performed on a nanoparticle using Au-nanoprism probes, revealing field localization at the vertices of the nanoprism.

引用

页码：1238 / +

页数：6

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