Structural, Optical and Morphological Properties of TiO2/Ag/TiO2 Multilayer Films

被引：0

作者：

Hasan, M. M. ^{[1
]}

Haseeb, A. S. M. A. ^{[1
]}

Saidur, R. ^{[1
]}

Masjuki, H. H. ^{[1
]}

Johan, M. R. ^{[1
]}

机构：

[1] Univ Malaya, Fac Engn, Kuala Lumpur 50603, Malaysia

来源：

NANOSCIENCE AND NANOTECHNOLOGY | 2009年 / 1136卷

关键词：

Multilayer coatings; dielectric material; structural and optical properties; TIO2; THIN-FILMS; HEAT-MIRROR; DEPOSITION;

D O I：

暂无

中图分类号：

TB3 [工程材料学];

学科分类号：

0805 ; 080502 ;

摘要：

In this investigation, TiO2/Ag/TiO2 multilayer-films were deposited on microscope glass slides with varying individual layer thicknesses by radio-frequency reactive magnetron sputtering. Prior to multilayer development, single layers of Ag and TiO2 were deposited and characterized. All the films were prepared at a moderately high pressure at room temperature. It was found that single layer of TiO2 showed anatase polycrystalline structure. It also exhibited high visible transmittance of above 80% and higher refractive index of 2.31 at a wavelength of 550 ran. The indirect optical band gap of the TiO2 films was estimated as 3.39 eV. The Ag single layer films were found to be crystalline with a very high reflectance for IR (Infra-red) light. Finally, the multilayers have been deposited and characterized by X-ray diffraction, UV-visible-IR spectrophotometry, scanning electron microscopy and profilometry.

引用

页码：229 / 233

页数：5

共 20 条

[1] Dielectric/Ag/dielectric coated energy-efficient glass windows for warm climates [J].