Photoabsorption characterization on surface InAs nanostructures using light-illuminated scanning tunneling microscopy

被引:8
作者
Takada, K
Takeuchi, M
Takahashi, T
机构
[1] Univ Tokyo, Inst Ind Sci, Meguro Ku, Tokyo 1538505, Japan
[2] RIKEN, Inst Phys & Chem Res, Wako, Saitama 3510198, Japan
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 2002年 / 41卷 / 7B期
关键词
STM; laser; photoabsorption; InAs; nanostructure; differential conductance;
D O I
10.1143/JJAP.41.4990
中图分类号
O59 [应用物理学];
学科分类号
摘要
We characterized surface InAs nanostructures grown on a GaAs vicinal substrate by using scanning tunneling microscopy (STM) under light illumination. In local photoinduced current imaging with a DC bias voltage, the photoabsorption signals on InAs nanowires could not be detected when the illuminated photon energy was adjusted between the band gaps of GaAs and InAs, due to electrical isolation of the surface InAs from the conductive substrate. On the other hand, imaging an optical response of differential conductance with AC bias modulation revealed a clear contrast between InAs nanowires and the surrounding GaAs region without the generation of photocarriers in the underlying GaAs.
引用
收藏
页码:4990 / 4993
页数:4
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