Improved electrical properties of La2/3Ba1/3MnO3:Ag0.04 thin films by thermal annealing

被引:2
|
作者
Liu, Xiang [1 ]
Yin, Xue-Peng [1 ]
Chen, Qing-Ming [1 ]
Zhang, Hui [1 ]
Zhang, Shao-Chun [1 ]
机构
[1] Kunming Univ Sci & Technol, Fac Mat Sci & Engn, Kunming 650093, Yunnan, Peoples R China
来源
APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING | 2014年 / 116卷 / 04期
关键词
TCR TEMPERATURE-COEFFICIENT; COLOSSAL MAGNETORESISTANCE; AG; MANGANITES; SR; BA;
D O I
10.1007/s00339-014-8344-0
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
La2/3Ba1/3MnO3:Ag-0.04 (LBMO:Ag-0.04) thin films were prepared on single crystalline (001)-orientated LaAlO3 substrates by pulsed laser deposition technique. Thermal annealing with temperatures of 780, 800 and 820 A degrees C has been investigated to improve electrical properties of the films. All the samples are shown along the (00l) orientation in rhombohedral structure with space group. With thermal annealing temperature increasing, insulator-metal transition temperature (T (p)) and resistivity at T (p) () of the epilayer reach optimal value of 288 K and 0.03 Omega A center dot cm, respectively. The electrical properties improvement of the LBMO:Ag-0.04 films is due to an improved film crystallization, oxygen balance and photon scattering suppression. The fitting curves show that the region of ferro-magnetic metallic (FM, T < T (p)) is fitted with grain/domain boundary, electron-electron and magnon scattering mechanism, as well as the region of para-magnetic insulating (PI, T > T (p)) is fitted with adiabatic small polaron hopping mechanism.
引用
收藏
页码:1853 / 1856
页数:4
相关论文
empty
未找到相关数据