Surface preparation effect on duplex stainless steel passive film electrical properties studied by in situ CSAFM

被引：7

作者：

Guo, L. Q. ^{[1
]}

Yang, B. J. ^{[1
]}

Liang, D. ^{[1
]}

Qiao, L. J. ^{[1
]}

机构：

[1] Univ Sci & Technol Beijing, Key Lab Environm Fracture MOE, Ctr Corros & Protect, Beijing 100083, Peoples R China

来源：

JOURNAL OF MATERIALS RESEARCH | 2015年 / 30卷 / 20期

基金：

中国国家自然科学基金;

关键词：

SEMICONDUCTING PROPERTIES; CORROSION BEHAVIOR; PITTING CORROSION; SUSCEPTIBILITY; RESISTANCE; MODEL; LAYER; GRAIN;

D O I：

10.1557/jmr.2015.245

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

The effect of surface preparation-grinding, polishing, and electrochemical etching-on the duplex stainless steel passive film conductivity was investigated by in situ current sensing atomic force microscopy. The current maps show that the current in the passive film on three prepared surfaces is different, especially for the ferrite and austenite phase surface. The current on the austenite and ferrite is similar on either mechanical ground or polished surfaces, but the current on the austenite surface is much higher than current on the ferrite surface after electrochemical etching. The difference in the passive film conductivity originates from the changes in the chemical composition and thickness of the passive film and the change in topographical properties induced by the preparation procedures. This is confirmed by AFM, x-ray photoelectron spectroscopy, and auger electron spectroscopy measurements.

引用

页码：3084 / 3092

页数：9

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