Plasma parameters and active species kinetics in CF4/O2/Ar gas mixture: Effects of CF4/O2 and O2/Ar mixing ratios

被引:0
作者
Lee, Junmyung [1 ]
Kwon, Kwang-Ho [1 ]
Efremov, A. [2 ]
机构
[1] Korea Univ, Dept Control & Instrumentat Engn, 2511 Sejong Ro, Sejong 339700, South Korea
[2] Ivanovo State Univ Chem & Technol, Dept Elect Devices & Mat Technol, 7 Sheremetevsky Av, Ivanovo 15300, Russia
来源
INTERNATIONAL CONFERENCE ON MICRO- AND NANO-ELECTRONICS 2016 | 2016年 / 10224卷
关键词
CF4; plasma; diagnostics; modeling; reaction kinetics; MODEL-BASED ANALYSIS; SURFACE KINETICS; SIMULATION;
D O I
10.1117/12.2266348
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The effects of both CF4/O-2 and O-2/Ar mixing ratios in three-component CF4/O-2/Ar mixture on plasma parameters, densities and fluxes of active species determining the dry etching kinetics were analyzed. The investigation combined plasma diagnostics by Langmuir probes and zero-dimensional plasma modeling. It was found that the substitution of CF4 for O-2 at constant fraction of Ar in a feed gas produces the non-monotonic change in F atom density, as it was repeatedly reported for the binary CF4/O-2 gas mixtures. At the same time, the substitution of Ar for O-2 at constant fraction of CF4 results in the monotonic increase in F atom density toward more oxygenated plasmas. The natures of these phenomena as well as theirs possible impacts on the etching/polymerization kinetics were discussed in details.
引用
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页数:8
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