Investigation of antiferroelectric liquid crystalline free-standing films by transmission ellipsometry

被引：10
|
作者：
Kobayashi, H
Matsuhashi, N
Okumoto, Y
Akahane, T
机构：
[1] Nagaoka Univ Technol, Fac Engn, Dept Elect Engn, Nagaoka, Niigata 9402188, Japan
[2] Hachinohe Natl Coll Technol, Dept Elect Engn, Hachinohe, Aomori 0391192, Japan
来源：
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS | 1999年 / 38卷 / 11期
关键词：
antiferroelectric liquid crystals; free standing film; ellipsometry;
D O I：
10.1143/JJAP.38.6428
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Thin free-standing films (FSFs) of an antiferroelectric liquid crystal (AFLC) were investigated by transmission ellipsometry. The phase difference between p-polarized and s-polarized light was measured as a function of the temperature and the incidence angle of the light beam. It was found that the structure of an FSF with two layers is anticlinic (SmCA*) throughout the temperature range investigated whereas the bulk sample shows several phases, from SmCA* to SmA phases. The four layer FSF showed only one phase transition (from SmCA* to SmA) in this temperature range. Even for such a thin film as one with five layers, a subphase or subphases between SmCA* and SmA were found.
引用
收藏
页码：6428 / 6432
页数：5
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