共 12 条
- [1] Copper diffusion in ZnS thin films [J]. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE, 2004, 201 (13): : 2948 - 2952
- [2] A bond valence analysis of electroluminescent ZnS:Cu, Cl to elucidate the aging mechanism [J]. ZEITSCHRIFT FUR KRISTALLOGRAPHIE, 1997, 212 (03): : 179 - 185
- [3] Fisher A.G., 1963, J ELECTROCHEM SOC, V110, P733
- [4] Hanes A, 1972, MANUALUL LNGINERULUI, VI
- [6] Interface diffusion under an electric field. Interface evolution [J]. INTERGRANULAR AND INTERPHASE BOUNDARIES IN MATERIALS, PT 1, 1996, 207- : 109 - 112
- [7] Ono Y., 1990, I ELECT INFORM COMMU, V89, P378
- [8] Popovych KO, 2007, SEMICOND PHYS QUANT, V10, P77
- [9] Shionoya S, 1998, PHOSPHOR HDB, P606
- [10] TANNAS LE, 1985, FLAT PANEL DISPLAYS, P24