Field-enhanced scanning near-field optical microscopy

被引：46

作者：

Bouhelier, Alexandre

机构：

[1] Argonne Natl Lab, Ctr Nanoscale Mat, Argonne, IL 60439 USA

[2] Argonne Natl Lab, Div Chem, Argonne, IL 60439 USA

来源：

MICROSCOPY RESEARCH AND TECHNIQUE | 2006年 / 69卷 / 07期

关键词：

electromagnetic enhancement; surface plasmons; multiphoton microscopy; Raman microscopy; optical resolution;

D O I：

10.1002/jemt.20328

中图分类号：

R602 [外科病理学、解剖学]; R32 [人体形态学];

学科分类号：

100101 ;

摘要：

This manuscript reviews the principles and recent advances of scanning near-field optical microscopy based on tip-induced field enhancement. These scanning microscopes utilize minute probes to locally enhance an electromagnetic field through a complex interplay between surface plasmon excitation and localization of electric charges by geometrical singularities. The necessary conditions leading to an electromagnetic enhancement will be reviewed, as well as the means to characterize it. A brief account of the theoretical framework will be given, together with applications of the technique ranging from chemical imaging to nanolithography.

引用

页码：563 / 579

页数：17

共 131 条

[1] Polarization effects in apertureless scanning near-field optical microscopy:: an experimental study [J].