Stability analysis of an oscillating tip-cantilever system in NC-AFM

被引:6
作者
Couturier, G [1 ]
Nony, L [1 ]
Boisgard, R [1 ]
Aimé, JP [1 ]
机构
[1] Univ Bordeaux 1, CPMOH, CNRS, UMR5798, F-33405 Talence, France
关键词
non-linear dynamics; dynamic force microscopy; stability analysis;
D O I
10.1016/S0169-4332(01)00948-5
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
This paper is a theoretical and a numerical investigation of the stability of a tip-cantilever system used in noncontact atomic force microscopy (NC-AFM) when it oscillates close to a surface. No additional dissipative force is considered. The theoretical approach is based on a variational method exploiting a coarse grained operation that gives the temporal dependence of the nonlinear-coupled equations of motion in amplitude and phase of the oscillator. Stability criterions for the resonance peak are deduced and predict a stable behavior of the oscillator in the vicinity of the resonance. The numerical approach is based on the results obtained with a virtual NC-AFM developed by our group. The effect of the size of the stable domain in phase is investigated. These results are in particularly good agreement with the theoretical predictions. Also they show the influence of the phase shifter in the feedback loop and the way it can affect the damping signal. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:341 / 348
页数:8
相关论文
共 24 条
[1]   Relationship between the non linear dynamic behaviour of an oscillating tip-microlever system and the contrast at the atomic scale [J].
Aimé, JP ;
Couturier, G ;
Boisgard, R ;
Nony, L .
APPLIED SURFACE SCIENCE, 1999, 140 (3-4) :333-338
[2]   Nonlinear dynamic behavior of an oscillating tip-microlever system and contrast at the atomic scale [J].
Aimé, JP ;
Boisgard, R ;
Nony, L ;
Couturier, G .
PHYSICAL REVIEW LETTERS, 1999, 82 (17) :3388-3391
[3]   FREQUENCY-MODULATION DETECTION USING HIGH-Q CANTILEVERS FOR ENHANCED FORCE MICROSCOPE SENSITIVITY [J].
ALBRECHT, TR ;
GRUTTER, P ;
HORNE, D ;
RUGAR, D .
JOURNAL OF APPLIED PHYSICS, 1991, 69 (02) :668-673
[4]   Cantilever dynamics in quasinoncontact force microscopy: Spectroscopic aspects [J].
Anczykowski, B ;
Kruger, D ;
Fuchs, H .
PHYSICAL REVIEW B, 1996, 53 (23) :15485-15488
[5]  
BAUMMERLIN M, 1996, PROBE MICROSC, V1, P3
[6]   A virtual non contact-atomic force microscope (NC-AFM):: Simulation and comparison with analytical models [J].
Couturier, G ;
Aimé, JP ;
Salardenne, J ;
Boisgard, R .
EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS, 2001, 15 (02) :141-147
[7]  
COUTURIER G, 2002, J APPL PHYS
[8]  
Dürig U, 1999, SURF INTERFACE ANAL, V27, P467, DOI 10.1002/(SICI)1096-9918(199905/06)27:5/6<467::AID-SIA519>3.0.CO
[9]  
2-7
[10]   Damping mechanism in dynamic force microscopy [J].
Gauthier, M ;
Tsukada, M .
PHYSICAL REVIEW LETTERS, 2000, 85 (25) :5348-5351