Vapor pressure and residual stress effects on the toughness of polymeric adhesive joints

被引:15
作者
Chew, HB [1 ]
Guo, TF [1 ]
Cheng, L [1 ]
机构
[1] Natl Univ Singapore, Dept Mech Engn, Singapore 117576, Singapore
关键词
fracture toughness; crack growth; void growth; adhesive; debonding;
D O I
10.1016/j.engfracmech.2004.01.005
中图分类号
O3 [力学];
学科分类号
08 ; 0801 ;
摘要
Parallel debonding along the two interfaces formed by a ductile polymeric film joining elastic substrates is studied. The film is taken to be elastic-plastic. The film-substrate interface is modeled by a strip of cells that incorporates vapor pressure effects on void growth and coalescence through a Gurson porous material relation. Thermal expansion mismatch between the film and the substrates is treated as an initial residual stress in the film. When residual stress is combined with high vapor pressure, interface cracking of the joint exhibits brittle-like characteristics with joint toughness reduced significantly. Other factors affecting joint toughness, such as initial porosity of the interface as well as strain hardening and thickness of the film are also discussed. (C) 2004 Elsevier Ltd. All rights reserved.
引用
收藏
页码:2435 / 2448
页数:14
相关论文
共 37 条
[1]  
Ashby M. F., 1997, CELLULAR SOLIDS STRU, DOI DOI 10.1017/CBO9781139878326
[2]   Vapor pressure assisted void growth and cracking of polymeric films and interfaces [J].
Cheng, L ;
Guo, TF .
INTERFACE SCIENCE, 2003, 11 (03) :277-290
[3]   PLASTIC-DEFORMATION ANALYSIS OF CRACKED ADHESIVE BONDS LOADED IN SHEAR [J].
CHIANG, MYM ;
CHAI, H .
INTERNATIONAL JOURNAL OF SOLIDS AND STRUCTURES, 1994, 31 (18) :2477-&
[4]   THE THERMOMECHANICAL INTEGRITY OF THIN-FILMS AND MULTILAYERS [J].
EVANS, AG ;
HUTCHINSON, JW .
ACTA METALLURGICA ET MATERIALIA, 1995, 43 (07) :2507-2530
[5]   Cell model for nonlinear fracture analysis - I. Micromechanics calibration [J].
Faleskog, J ;
Gao, XS ;
Shih, CF .
INTERNATIONAL JOURNAL OF FRACTURE, 1998, 89 (04) :355-373
[6]   The effect of hole size upon the strength of metallic and polymeric foams [J].
Fleck, NA ;
Olurin, OB ;
Chen, C ;
Ashby, MF .
JOURNAL OF THE MECHANICS AND PHYSICS OF SOLIDS, 2001, 49 (09) :2015-2030
[7]  
FUKUZAWA I, 1995, IEEE IRPS INT REL PH, P192
[8]   POPCORNING - A FAILURE-MECHANISM IN PLASTIC-ENCAPSULATED MICROCIRCUITS [J].
GALLO, AA ;
MUNAMARTY, R .
IEEE TRANSACTIONS ON RELIABILITY, 1995, 44 (03) :362-367
[9]   Moisture absorption and desorption predictions for plastic ball grid array packages [J].
Galloway, JE ;
Miles, BM .
IEEE TRANSACTIONS ON COMPONENTS PACKAGING AND MANUFACTURING TECHNOLOGY PART A, 1997, 20 (03) :274-279
[10]   Simulation of ductile crack growth using computational cells: numerical aspects [J].
Gullerud, AS ;
Gao, XS ;
Dodds, RH ;
Haj-Ali, R .
ENGINEERING FRACTURE MECHANICS, 2000, 66 (01) :65-92