Dissipated energy in tapping mode by the atomic force microscope

被引：2

作者：

de Carvalho Lopes, Gerson Anderson ^{[1
]}

da Fonseca Filho, Henrique Duarte ^{[2
]}

机构：

[1] Univ Estadual Amapa, Ctr Educ Engn & Matemat, Macapa, Amapa, Brazil

[2] Univ Fed Amapa, Dept Fis, Lab Ciencias Mat, Macapa, Amapa, Brazil

来源：

ACTA SCIENTIARUM-TECHNOLOGY | 2015年 / 37卷 / 04期

关键词：

phase contrast; plastic deformations; tip; nanoscale; PHASE-CONTRAST;

D O I：

10.4025/actascitechnol.v37i4.27519

中图分类号：

O [数理科学和化学]; P [天文学、地球科学]; Q [生物科学]; N [自然科学总论];

学科分类号：

07 ; 0710 ; 09 ;

摘要：

Dissipated energy measurements between a tip of an AFM and a sample have been used to analyze variations in mechanical and tribological properties of materials, using tapping mode AFM to generate topography and phase contrast images. Furthermore it's possible to perform indentations in the material with this operation mode and to create micro-controlled defects, in diameter and depth, to growing of quantum dots in semiconductor materials. In this paper, we discuss the fundamentals of this technique.

引用

页码：403 / 409

页数：7

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