Performance of bulk SiC radiation detectors

被引:35
作者
Cunningham, W [1 ]
Gouldwell, A
Lamb, G
Scott, J
Mathieson, K
Roy, P
Bates, R
Thornton, P
Smith, KM
Cusco, R
Glaser, M
Rahman, M
机构
[1] Univ Glasgow, Dept Phys & Astron, Glasgow G12 8QQ, Lanark, Scotland
[2] CSIC, Inst Jaime Almera, Barcelona 08028, Spain
[3] CERN, Div EP, CH-1211 Geneva, Switzerland
关键词
semi-insulating SiC; dry etch damage; radiation damage; radiation detection;
D O I
10.1016/S0168-9002(02)00941-5
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
SiC is a wide-gap material with excellent electrical and physical properties that may make it an important material for some future electronic devices. The most important possible applications of SiC are in hostile environments, such as in car/jet engines, within nuclear reactors, or in outer space. Another area where the material properties, most notably radiation hardness, would be valuable is in the inner tracking detectors of particle physics experiments. Here, we describe the performance of SiC diodes irradiated in the 24 GeV proton beam at CERN. Schottky measurements have been used to probe the irradiated material for changes in I-V characteristics. Other methods, borrowed from III-V research, used to study the irradiated surface include atomic force microscope scans and Raman spectroscopy. These have been used to observe the damage to the materials surface and internal lattice structure. We have also characterised the detection capabilities of bulk semi-insulating SiC for a radiation. By measuring the charge collection efficiency (CCE) for variations in bias voltage, CCE values up to 100% have been measured. (C) 2002 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:33 / 39
页数:7
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