Fault detection and diagnosis using wavelet based transient current analysis

被引：2
|
作者：
Bhunia, S [1 ]
Roy, K [1 ]
机构：
[1] Purdue Univ, Sch Elect & Comp Engn, W Lafayette, IN 47907 USA
来源：
DESIGN, AUTOMATION AND TEST IN EUROPE CONFERENCE AND EXHIBITION, 2002 PROCEEDINGS | 2002年
关键词：
D O I：
10.1109/DATE.2002.998474
中图分类号：
TP3 [计算技术、计算机技术];
学科分类号：
0812 ;
摘要：
We present a novel integrated method for fault detection and localization using wavelet transform of transient current (IDD) waveform. The time-frequency resolution property of wavelet helps us detect as well as localize faults in digital CMOS circuits. Experiments performed on an 8-bit ALU show promising results for both detection and localization.
引用
收藏
页码：1118 / 1118
页数：1
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