The formation of porous GaAs in HF solutions

被引:51
作者
Oskam, G [1 ]
Natarajan, A [1 ]
Searson, PC [1 ]
Ross, FM [1 ]
机构
[1] LAWRENCE BERKELEY NATL LAB,NATL CTR ELECTRON MICROSCOPY,BERKELEY,CA 94720
关键词
porous GaAs; electrochemical pore formation; TEM; SANS;
D O I
10.1016/S0169-4332(97)00184-0
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The electrochemical etching of n-type GaAs in HF solutions in the dark results in the formation of a porous layer. The pore density, the pore dimensions and the structure of the porous layer depend on the doping density and the crystallographic orientation of the surface. The pore morphology of porous GaAs is essentially independent of the applied current. The pore front velocity is linearly proportional to the current and the porous layer can be grown to any thickness. The primary pores in GaAs grow in the [111] a direction which is in contrast with silicon where the pores grow in the [100] direction. The pore diameters increase from 80 nm for highly doped GaAs to 400 nm for undoped GaAs. The combination of electrochemical methods and structural analysis techniques, including transmission electron microscopy and small angle neutron scattering, leads to a better understanding of anisotropic etching of semiconductors. (C) 1997 Elsevier Science B.V.
引用
收藏
页码:160 / 168
页数:9
相关论文
共 30 条
[1]  
Bacon G. E., 1975, NEUTRON DIFFRACTION
[2]   AN EXPERIMENTAL AND THEORETICAL-STUDY OF THE FORMATION AND MICROSTRUCTURE OF POROUS SILICON [J].
BEALE, MIJ ;
BENJAMIN, JD ;
UREN, MJ ;
CHEW, NG ;
CULLIS, AG .
JOURNAL OF CRYSTAL GROWTH, 1985, 73 (03) :622-636
[3]  
CANHAM LT, 1991, NATURE, V353, P335
[4]   JET POLISHING OF SEMICONDUCTORS .2. ELECTROCHEMICALY FORMED TUNNELS IN GAP [J].
CHASE, BD ;
HOLT, DB .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1972, 119 (03) :314-&
[5]   POROUS ETCHING - A MEANS TO ENHANCE THE PHOTORESPONSE OF INDIRECT SEMICONDUCTORS [J].
ERNE, BH ;
VANMAEKELBERGH, D ;
KELLY, JJ .
ADVANCED MATERIALS, 1995, 7 (08) :739-742
[6]   ELECTROCHEMICALLY ETCHED TUNNELS IN GALLIUM-ARSENIDE [J].
FAKTOR, MM ;
FIDDYMENT, DG ;
TAYLOR, MR .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1975, 122 (11) :1566-1567
[7]   ETCHING BEHAVIOR OF THE (110) AND (100) SURFACES OF INSB [J].
GATOS, HC ;
LAVINE, MC .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1960, 107 (05) :433-436
[8]   UBER DEN MECHANISMUS DER ANODISCHEN AUFLOSUNG VON GALLIUMARSENID [J].
GERISCHER, H .
BERICHTE DER BUNSEN-GESELLSCHAFT FUR PHYSIKALISCHE CHEMIE, 1965, 69 (07) :578-+
[9]   WASSERSTOFFABSCHEIDUNG UND ABLAUF VON REDOXREAKTIONEN AN GALLIUMARSENID [J].
GERISCHER, H ;
MATTES, I .
ZEITSCHRIFT FUR PHYSIKALISCHE CHEMIE-FRANKFURT, 1966, 49 (1-2) :112-+
[10]   Silicon-based visible light-emitting devices integrated into microelectronic circuits [J].
Hirschman, KD ;
Tsybeskov, L ;
Duttagupta, SP ;
Fauchet, PM .
NATURE, 1996, 384 (6607) :338-341