Copper-phthalocyanine ultra thin films grown onto Al(100) surface investigated by synchrotron radiation

被引：32
作者：
Ruocco, A
Evangelista, F
Attili, A
Donzello, MP
Betti, MG
Giovanelli, L
Gotter, R
机构：
[1] Univ Roma Tre, INFM, Unita Roma Tre, I-00146 Rome, Italy
[2] Univ Roma Tre, Dipartimento Fis, I-00146 Rome, Italy
[3] INFM, Lab Nazl TASC, I-34012 Trieste, Italy
[4] Univ Roma La Sapienza, INFM, Unita Roma Uno, I-00185 Rome, Italy
[5] Univ Roma La Sapienza, Dipartimento Fis, I-00185 Rome, Italy
来源：
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA | 2004年 / 137卷
关键词：
copper-phthalocyanine; Al(100); core level photoemission; organic molecule; polarization dependent X-ray absorption;
D O I：
10.1016/j.elspec.2004.02.092
中图分类号：
O433 [光谱学];
学科分类号：
0703 ; 070302 ;
摘要：
In this work X-ray photoemission spectroscopy (XPS) and X-ray absorption spectroscopy (XAS) are employed to study the CuPc/Al(1 0 0) organic-inorganic interface. The C ls core level, investigated for three different coverages, shows sharp differences in passing from bulk to monolayer range CuPc film: in particular the shake-up satellite is not visible in the early stages of adsorption, suggesting a strong molecule-substrate interaction. XAS at the Cu L-3 edge was employed to study the molecular orientation with respect to the substrate. In the case of a 40 Angstrom CuPc film the molecular plane was found to be almost perpendicular to the substrate surface. (C) 2004 Elsevier B.V. All rights reserved.
引用
收藏
页码：165 / 169
页数：5
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