Error signal artifact in apertureless scanning near-field optical microscopy

被引：13
|
作者：
Billot, L.
Lamy de la Chapelle, M.
Barchiesi, D.
Chang, S. -H.
Gray, S. K.
Rogers, J. A.
Bouhelier, A.
Adam, P. -M.
Bijeon, J. -L.
Wiederrecht, G. P.
Bachelot, R.
Royer, P.
机构：
[1] Univ Technol Troyes, Lab Nanotechnol & Instrumentat Opt, Inst Charles Delaunay, CNRS,FRE 2848, Troyes 10010, France
[2] Univ Illinois, Dept Mat Sci & Engn, Urbana, IL 61801 USA
[3] Univ Illinois, Dept Chem, Urbana, IL 61801 USA
[4] Argonne Natl Lab, Chem Div, Argonne, IL 60439 USA
[5] Argonne Natl Lab, Ctr Nanoscale Mat, Argonne, IL 60439 USA
来源：
APPLIED PHYSICS LETTERS | 2006年 / 89卷 / 02期
关键词：
D O I：
10.1063/1.2219134
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
Apertureless scanning near-field optical microscopy is a method for obtaining subwavelength optical images of nanostructures. However, great care must be taken to avoid artifactual images. We report on one artifact related to the error signal in cantilever vibration amplitude when operating in tapping mode atomic force microscopy. The artifact is described experimentally and modeled by electromagnetic calculations based on the finite element method. We report specific steps to identify and avoid this artifact with experimental results on gold nanostructures. It is suggested that future apertureless scanning near-field optical microscopy studies verify that optical image does not correlate with error signal. (c) 2006 American Institute of Physics.
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页数：3
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