Analysis of anisotropic damage in forged Al-Cu-Mg-Si alloy based on creep tests, micrographs of fractured specimen and digital image correlations

被引:22
作者
Gariboldi, Elisabetta [1 ]
Naumenko, Konstantin [2 ]
Ozhoga-Maslovskaja, Oksana [1 ]
Zappa, Emanuele [1 ]
机构
[1] Politecn Milan, Dept Mech Engn, Via La Masa 34, I-20156 Milan, Italy
[2] Univ Magdeburg, Inst Mech, D-39106 Magdeburg, Germany
来源
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING | 2016年 / 652卷
关键词
Al-Cu-Mg-Si alloy; Elongated grains; Creep damage; Notched specimen; Creep crack growth; Digital image correlation; SPECKLE PATTERNS; MODEL; BEHAVIOR; TEMPERATURE;
D O I
10.1016/j.msea.2015.11.090
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The aim of this paper is to analyze anisotropic damage mechanisms in forged Al-Cu-Mg-Si alloy based on the results of creep tests. Smooth specimens are sampled in three forging directions. Creep strain vs. time curves as well as light optical microscope and scanning electron microscope observations illustrate basic features of damage growth. Flat notch specimens are sampled in different directions to analyze stress redistributions and damage in zones of stress concentration. The digital image correlation technique has been applied in situ in order to extract the strain values on the surface of the notched specimens. All observations demonstrate that the principal origins of anisotropic creep and damage are associated with elongated grains and second phase clustered particles located at grain boundaries. Longitudinal specimens possess nucleations of decohesion sites and growth of voids around second phase particles at grain boundaries. Damage evolution for radial and transverse specimens is due to the formation and growth of cracks in second phase particles orthogonal to the principal stress axis. Residual strains are confined to the notch root as well as to the flanges of advanced macrocrack, indicating the small scale yielding during the creep fracture process. (C) 2015 Elsevier B.V. All rights reserved.
引用
收藏
页码:175 / 185
页数:11
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