(Ba, Sr)3MgSi2O8 structure change caused by Ba/Sr replacement

被引:13
|
作者
Yonezaki, Yoshinori [1 ]
机构
[1] Univ Yamanashi, Interdisciplinary Grad Sch Med & Engn, Miyamae 7-32, Kofu, Yamanashi 4008511, Japan
关键词
silicate; crystal structure; Raman spectroscopy; X-ray diffraction; FERROELASTIC PHASE-TRANSITION; CRYSTAL-STRUCTURE; LUMINESCENT PROPERTIES; 3-DIMENSIONAL VISUALIZATION; PHOSPHOR; BA; EU2+; K3NA(SEO4)2; DISORDER; SR;
D O I
10.1017/S0885715614000803
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Crystal structure of BaxSr3-xMgSi2O8 has been determined by Raman spectroscopy and X-ray diffraction. The solid solution series have glaserite-type layered structures made of corner-sharing SiO4 tetrahedra and MgO6 octahedra. Ba2+ and Sr2+ ions are sandwiched in between the layers. Raman spectroscopy has found that structural symmetry changes at x = 0.5 and 2.5. Structural refinement by the Rietveld method has clarified that the symmetry changes occur among C2 (Z = 4), P (3) over bar m1 (Z = 1), and P (3) over bar (Z = 3). They originate in SiO4 tilting caused by size mismatch between alkaliearth cations and their site spaces. For x <= 0.5, SiO4 tilting occur every other interlayer space, whereas for x >= 2.5, all the SiO4 tilt. (C) 2014 International Centre for Diffraction Data.
引用
收藏
页码:40 / 51
页数:12
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