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(Ba, Sr)3MgSi2O8 structure change caused by Ba/Sr replacement
被引:13
|作者:
Yonezaki, Yoshinori
[1
]
机构:
[1] Univ Yamanashi, Interdisciplinary Grad Sch Med & Engn, Miyamae 7-32, Kofu, Yamanashi 4008511, Japan
关键词:
silicate;
crystal structure;
Raman spectroscopy;
X-ray diffraction;
FERROELASTIC PHASE-TRANSITION;
CRYSTAL-STRUCTURE;
LUMINESCENT PROPERTIES;
3-DIMENSIONAL VISUALIZATION;
PHOSPHOR;
BA;
EU2+;
K3NA(SEO4)2;
DISORDER;
SR;
D O I:
10.1017/S0885715614000803
中图分类号:
TB3 [工程材料学];
学科分类号:
0805 ;
080502 ;
摘要:
Crystal structure of BaxSr3-xMgSi2O8 has been determined by Raman spectroscopy and X-ray diffraction. The solid solution series have glaserite-type layered structures made of corner-sharing SiO4 tetrahedra and MgO6 octahedra. Ba2+ and Sr2+ ions are sandwiched in between the layers. Raman spectroscopy has found that structural symmetry changes at x = 0.5 and 2.5. Structural refinement by the Rietveld method has clarified that the symmetry changes occur among C2 (Z = 4), P (3) over bar m1 (Z = 1), and P (3) over bar (Z = 3). They originate in SiO4 tilting caused by size mismatch between alkaliearth cations and their site spaces. For x <= 0.5, SiO4 tilting occur every other interlayer space, whereas for x >= 2.5, all the SiO4 tilt. (C) 2014 International Centre for Diffraction Data.
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页码:40 / 51
页数:12
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