A curved image-plate detector system for high-resolution synchrotron X-ray diffraction

被引:10
作者
Sarin, P. [1 ]
Haggerty, R. P. [1 ]
Yoon, W. [1 ]
Knapp, M. [2 ]
Berghaeuser, A. [3 ]
Zschack, P. [4 ]
Karapetrova, E. [4 ]
Yang, N. [4 ]
Kriven, W. M. [1 ]
机构
[1] Univ Illinois, Dept Mat Sci & Engn, Urbana, IL 61801 USA
[2] Tech Univ Darmstadt, Inst Mat Sci, D-64287 Darmstadt, Germany
[3] Univ Hamburg, Inst Mineral & Petrog, D-20146 Hamburg, Germany
[4] Argonne Natl Lab, Adv Photon Source, Argonne, IL 60439 USA
关键词
X-ray detectors; image-plate detector; powder diffraction; high-resolution diffraction; in situ diffraction; POSITION-SENSITIVE DETECTOR; POWDER DIFFRACTOMETER; HIGH-TEMPERATURE; SPRING-8; BL02B2; GUINIER CAMERA; IN-SITU; TRANSFORMATIONS; CHAMBER;
D O I
10.1107/S0909049509001265
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
The developed curved image plate (CIP) is a one-dimensional detector which simultaneously records high-resolution X-ray diffraction (XRD) patterns over a 38.7 degrees 2 theta range. In addition, an on-site reader enables rapid extraction, transfer and storage of X-ray intensity information in <= 30 s, and further qualifies this detector to study kinetic processes in materials science. The CIP detector can detect and store X-ray intensity information linearly proportional to the incident photon flux over a dynamical range of about five orders of magnitude. The linearity and uniformity of the CIP detector response is not compromised in the unsaturated regions of the image plate, regardless of saturation in another region. The speed of XRD data acquisition together with excellent resolution afforded by the CIP detector is unique and opens up wide possibilities in materials research accessible through X-ray diffraction. This article presents details of the basic features, operation and performance of the CIP detector along with some examples of applications, including high-temperature XRD.
引用
收藏
页码:273 / 282
页数:10
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