Infrared spectral emissivity characterization facility at NIST

被引：42

作者：

Hanssen, L ^{[1
]}

Mekhontsev, S ^{[1
]}

Khromchenko, V ^{[1
]}

机构：

[1] NIST, Opt Technol Div, Gaithersburg, MD 20899 USA

来源：

THERMOSENSE XXVI | 2004年 / 5405卷

关键词：

spectral emittance; spectral emissivity; infrared; blackbody; sphere reflectometer;

D O I：

10.1117/12.542224

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

A new facility for the measurement of spectral emittance (emissivity) of materials that employs a set of blackbody sources is being built at NIST. This facility has also been used to investigate the capabilities of Fourier transform (FT) spectrometers to characterize the spectral emissivity of blackbody sources. The facility covers the spectral range of 1 mum to 20 girt and temperatures from 600 K to 1400 K. The principle of operation involves the spectral comparison of an unknown source with a group of variable temperature and fixed point reference sources by means of the FT spectrometer and filter radiometers. Sample surface temperature is measured by non-contact method using a sphere reflectometer. The current reflectometer setup allows measurements of opaque samples, but it is planned to include semitransparent materials at a later stage.

引用

页码：1 / 12

页数：12

共 11 条

[1]

Battuello M., 1989, HIGH TEMP HIGH PRESS, V21, P303

[2] High-quality Brewster's angle polarizer for broadband infrared application [J].