Note: Design of a laser feedback interferometer with double diffraction system

被引:10
作者
Guo, Dongmei [1 ]
Wang, Ming [1 ]
机构
[1] Nanjing Normal Univ, Sch Phys Sci & Technol, Jiangsu Key Lab Optoelect Technol, Nanjing 210023, Jiangsu, Peoples R China
基金
中国国家自然科学基金;
关键词
GRATING INTERFEROMETRY;
D O I
10.1063/1.4931781
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
A novel laser feedback interferometer with double diffraction system is proposed in this paper. A beam emitted from the laser is incident onto a transmission grating. The mth order beam is vertically reflected by a mirror and diffracted again by the grating. The double-diffracted beam returns into the laser cavity and mixes with the light inside the active cavity, thus generating a modulation of both the amplitude and the frequency of the lasing field. Theoretical analysis and experimental observations show that the output signal of the proposed system depends on the grating pitch and the direction of the phase movement can be obtained from inclination of the interference signal. It provides a potential displacement sensor with high stability and quite a compact configuration. (C) 2015 AIP Publishing LLC.
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页数:3
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共 7 条
[1]   Linear diffraction grating interferometer with high alignment tolerance and high accuracy [J].
Cheng, Fang ;
Fan, Kuang-Chao .
APPLIED OPTICS, 2011, 50 (22) :4550-4556
[2]   Research on long-range grating interferometry with nanometer resolution [J].
Chu, Xingchun ;
Lue, Haibao ;
Zhao, Shanghong .
MEASUREMENT SCIENCE AND TECHNOLOGY, 2008, 19 (01)
[3]   Measurement of the velocity inside an all-fiber DBR laser by self-mixing technique [J].
Du, Zhengting ;
Lu, Liang ;
Zhang, Wenhua ;
Yang, Bo ;
Gui, Huaqiao ;
Yu, Benli .
APPLIED PHYSICS B-LASERS AND OPTICS, 2013, 113 (01) :153-158
[4]   Goniometric optical scatter instrument for out-of-plane ellipsometry measurements [J].
Germer, TA ;
Asmail, CC .
REVIEW OF SCIENTIFIC INSTRUMENTS, 1999, 70 (09) :3688-3695
[5]   Grating interferometry with a semiconductor light source [J].
Kozlowska, A ;
Kujawinska, M ;
Gorecki, C .
APPLIED OPTICS, 1997, 36 (31) :8116-8120
[6]   Optical heterodyne grating interferometry for displacement measurement with subnanometric resolution [J].
Lee, Ju-Yi ;
Chen, Hui-Yi ;
Hsu, Cheng-Chih ;
Wu, Chyan-Chyi .
SENSORS AND ACTUATORS A-PHYSICAL, 2007, 137 (01) :185-191
[7]   Simultaneous measurement of refractive-index and thickness for optical materials by laser feedback interferometry [J].
Xu, Ling ;
Zhang, Shulian ;
Tan, Yidong ;
Sun, Liqun .
REVIEW OF SCIENTIFIC INSTRUMENTS, 2014, 85 (08)