DETECTING INCLUSIONS IN ELECTRICAL IMPEDANCE TOMOGRAPHY WITHOUT REFERENCE MEASUREMENTS

被引：29

作者：

Harrach, Bastian ^{[1
]}

Seo, Jin Keun ^{[2
]}

机构：

[1] Johannes Gutenberg Univ Mainz, Inst Math, D-55099 Mainz, Germany

[2] Yonsei Univ, Seoul 120749, South Korea

来源：

SIAM JOURNAL ON APPLIED MATHEMATICS | 2009年 / 69卷 / 06期

关键词：

inverse problems; electrical impedance tomography; complex conductivity; frequency-difference measurements; factorization method; COMPLETE ELECTRODE MODEL; FACTORIZATION METHOD; NUMERICAL IMPLEMENTATION; SMALL INHOMOGENEITIES; ELLIPTIC PROBLEMS; CONDUCTIVITY; ALGORITHM; BOUNDARY; FEASIBILITY; SCATTERING;

D O I：

10.1137/08072142X

中图分类号：

O29 [应用数学];

学科分类号：

070104 ;

摘要：

We develop a new variant of the factorization method that can be used to detect inclusions in electrical impedance tomography from either absolute current-to-voltage measurements at a single, nonzero frequency or from frequency-difference measurements. This eliminates the need for numerically simulated reference measurements at an inclusion-free body and thus greatly improves the method's robustness against forward modeling errors, e. g., in the assumed body's shape.

引用

页码：1662 / 1681

页数：20

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