A Survey of Analog-to-Digital Converters for Operation under Radiation Environments

被引:3
作者
Pun-Garcia, Ernesto [1 ,2 ,3 ]
Lopez-Vallejo, Marisa [2 ]
机构
[1] Arquimea Ingn SLU, R&D Dept, Leganes 28918, Spain
[2] Univ Politecn Madrid, IPTC, ETSI Telecomunicac, Madrid 28040, Spain
[3] Calle Margarita Salas 10, Madrid 28918, Spain
关键词
ADC performance patterns; ADC state of the art; ADC survey; analog-to-digital converters; applications under radiation environments; figure of merit under radiation; radenv-ADC design guidelines; radiation effects; radiation hardening; radiation test methods; SPACE; SENSITIVITY; MECHANISMS; SIGNATURES; CMOS; SEE;
D O I
10.3390/electronics9101694
中图分类号
TP [自动化技术、计算机技术];
学科分类号
0812 ;
摘要
In this work, we analyze in depth multiple characteristic data of a representative population of radenv-ADCs (analog-to-digital converters able to operate under radiation). Selected ADCs behave without latch-up below 50 MeV.cm(2)/mg and are able to bear doses of ionizing radiation above 50 krad(Si). An exhaustive search of ADCs with radiation characterization data has been carried out throughout the literature. The obtained collection is analyzed and compared against the state of the art of scientific ADCs, which reached years ago the electrical performance that radenv-ADCs provide nowadays. In fact, for a given Nyquist sampling rate, radenv-ADCs require significantly more power to achieve lower effective resolution. The extracted performance patterns and conclusions from our study aim to serve as reference for new developments towards more efficient implementations. As tools for this purpose, we have conceived FOMTID and FOMSET, two new figures of merit to compare radenv-ADCs that consider electrical and radiation performance.
引用
收藏
页码:1 / 27
页数:27
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