Charged particles and x-ray emission studies on a dense plasma focus device

被引:0
作者
Chung, S. R. [1 ]
Behbahani, R. A. [1 ]
Xiao, C. [1 ]
机构
[1] Univ Saskatchewan, Dept Phys & Engn Phys, Plasma Phys Lab, Saskatoon, SK, Canada
来源
RADIATION EFFECTS AND DEFECTS IN SOLIDS | 2020年 / 175卷 / 11-12期
基金
加拿大自然科学与工程研究理事会;
关键词
Dense plasma focus; ion beam; soft x-ray;
D O I
10.1080/10420150.2020.1845693
中图分类号
TL [原子能技术]; O571 [原子核物理学];
学科分类号
0827 ; 082701 ;
摘要
The emission of charged particles, electron and ion beams, and radiation, soft and hard x-rays, from the pinching plasma have been investigated in the UofS-I dense plasma focus (DPF) device. The UofS-I DPF is in a Mather-type configuration, powered by a 2 kJ, 25 kV-charged capacitor bank, operated with 10-20 mTorr argon gas. The charged particles have been recorded using a Faraday cup for ion beam collection, and a charge collector and a Rogowski coil for the electron beam measurement. Moreover, the soft and hard x-rays have been detected using a BPX-65, filtered silicon PIN photodiode and a scintillator, respectively. The time delays of signals with respect to the pinch time have been compared. Strong correlations of the charged particles and the x-ray emission intensities with the voltage peak and current dip have been observed, and consequently indicate their dependence on the anode voltage and strength of pinching of plasma.
引用
收藏
页码:1015 / 1020
页数:6
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