Design and Analysis of RF MEMS Capacitive Shunt Switch and Impact of Geometric Trade-offs on RF Performance

The electromagnetic and the electromechanical characteristics of the radio frequency micro-electro-mechanical-system (RF MEMS) switches for high-frequency applications are the critical performance metrics that need to optimize. Performance indices of the RF MEMS switches such as isolation, insertion loss, pull-in voltage, holddown voltage, reliability are dependent on types and properties of conducting and insulating materials that are used in the construction of switch. This article proposes the design and analysis of the two terminal capacitive shunt switches built on a coplanar waveguide (CPW) for applications in subsets of Ka- and V-Band frequency range. The proposed switch used a fixed-fixed gold membrane with the low-spring constant uniform single meander flexures support and achieved a low pull-in voltage of 5.1 Volts. An impact of the variation of the geometric parameter trade-offs like conducting membrane height, dielectric material height, and the air gap between the membrane and the dielectric materials like Silicon Nitride (Si3N4) and Hafnium Dioxide (HfO2) are studied to investigate RF and electromechanical performance of the switch.