Double metal subwavelength slit arrays interference to measure the orbital angular momentum and the polarization of light

被引：41

作者：

Zhou, Hailong ^{[1
]}

Yan, Siqi ^{[1
]}

Dong, Jianji ^{[1
]}

Zhang, Xinliang ^{[1
]}

机构：

[1] Huazhong Univ Sci & Technol, Wuhan Natl Lab Optoelect, Wuhan 430074, Peoples R China

来源：

OPTICS LETTERS | 2014年 / 39卷 / 11期

基金：

中国国家自然科学基金;

关键词：

TRANSFORMATION; DIFFRACTION; PHOTONS; STATES; MODES; BEAMS;

D O I：

10.1364/OL.39.003173

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We put forward a double-slit interference device based on two metal subwavelength slit arrays to measure the orbital angular momentum (OAM) and the polarization of beams simultaneously. The subwavelength slit serves as a localized spatial polarizer, and each slit array can be regarded as a wide diffraction-slit. When an OAM beam is normally incident upon the two slit arrays, the interference fringes twist, and the displacement depends on the topological charge of OAM beams. We present a detailed theoretical analysis of this measurement model. This model does not need additional reference light and is a linear model. (C) 2014 Optical Society of America

引用

页码：3173 / 3176

页数：4

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