Fabrication of BaSi2 films on (111)-oriented Si layers formed by inverted Al-induced crystallization method on glass structure

被引:1
作者
Numata, Ryohei [1 ]
Toko, Kaoru [1 ]
Usami, Noritaka [2 ]
Suemasu, Takashi [1 ]
机构
[1] Univ Tsukuba, Inst Appl Phys, 1-1-1 Tennodai, Tsukuba, Ibaraki 3058571, Japan
[2] Nagoya Univ, Mat Phys & Energy Engn, Nagoya, Aichi 464, Japan
来源
PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 10, NO 12 | 2013年 / 10卷 / 12期
关键词
BaSi2; Al-induced crystallization; polycrystalline Si; ALUMINUM-INDUCED CRYSTALLIZATION; MOLECULAR-BEAM EPITAXY; THIN-FILMS; AMORPHOUS-SILICON; ORIENTATION; THICKNESS; INTERFACE; EXCHANGE;
D O I
10.1002/pssc.201300336
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The formation process of high-quality BaSi2 films on glass substrates was investigated. A polycrystal-Si/Al/SiO2 structure was prepared by means of the inverted Al-induced crystallization technique. Electron backscatter diffraction (EBSD) measurements revealed that the crystal orientation of the grown Si layer varied significantly depending on the Al/Si thickness: The (111) orientation fraction reached 97% for the 50-nm-thick sample and the (100) orientation fraction reached 88% for the 200-nm-thick sample. These oriented Si layers on SiO2 glass substrates were used as templates for BaSi2 growth. The theta-2 theta X-ray diffraction patterns indicated the formation of BaSi2 films. [GRAPHICS] (C) 2013 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim
引用
收藏
页码:1769 / 1772
页数:4
相关论文
共 23 条
[1]   Solid-phase crystallization of amorphous silicon on ZnO:Al for thin-film solar cells [J].
Becker, C. ;
Conrad, E. ;
Dogan, P. ;
Fenske, F. ;
Gorka, B. ;
Haenel, T. ;
Lee, K. Y. ;
Rau, B. ;
Ruske, F. ;
Weber, T. ;
Berginski, M. ;
Huepkes, J. ;
Gall, S. ;
Rech, B. .
SOLAR ENERGY MATERIALS AND SOLAR CELLS, 2009, 93 (6-7) :855-858
[2]   Direct in situ transmission electron microscopy observation of Al push up during early stages of the Al-induced layer exchange [J].
Birajdar, B. I. ;
Antesberger, T. ;
Butz, B. ;
Stutzmann, M. ;
Spiecker, E. .
SCRIPTA MATERIALIA, 2012, 66 (08) :550-553
[3]   Large-grained poly-silicon thin films by aluminium-induced crystallisation of microcrystalline silicon [J].
Ekanayake, G. ;
Quinn, T. ;
Reehal, H. S. .
JOURNAL OF CRYSTAL GROWTH, 2006, 293 (02) :351-358
[4]   Interface-controlled layer exchange in metal-induced crystallization of germanium thin films [J].
Hu, Shu ;
Marshall, Ann F. ;
McIntyre, Paul C. .
APPLIED PHYSICS LETTERS, 2010, 97 (08)
[5]   Epitaxial growth of semiconducting BaSi2 thin films on Si(111) substrates by reactive deposition epitaxy [J].
Inomata, Y ;
Nakamura, T ;
Suemasu, T ;
Hasegawa, F .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2004, 43 (7A) :4155-4156
[6]   Thin Film Solar Cells Prepared on Low Thermal Budget Polycrystalline Silicon Seed Layers [J].
Jaeger, Christian ;
Matsui, Takuya ;
Takeuchi, Masayoshi ;
Karasawa, Minoru ;
Kondo, Michio ;
Stutzmann, Martin .
JAPANESE JOURNAL OF APPLIED PHYSICS, 2010, 49 (11)
[7]   On the Controlling Mechanism of Preferential Orientation of Polycrystalline-Silicon Thin Films Grown by Aluminum-Induced Crystallization [J].
Jung, Mina ;
Okada, Atsushi ;
Saito, Takanobu ;
Suemasu, Takashi ;
Usami, Noritaka .
APPLIED PHYSICS EXPRESS, 2010, 3 (09)
[8]   Inverted Aluminum-Induced Layer Exchange Method for Thin Film Polycrystalline Silicon Solar Cells on Insulating Substrates [J].
Kuraseko, Hiroshi ;
Orita, Nobuaki ;
Koaizawa, Hisashi ;
Kondo, Michio .
APPLIED PHYSICS EXPRESS, 2009, 2 (01) :0155011-0155013
[9]   Al-Induced oriented-crystallization of Si films on quartz and its application to epitaxial template for Ge growth [J].
Kurosawa, Masashi ;
Toko, Kaoru ;
Kawabata, Naoyuki ;
Sadoh, Taizoh ;
Miyao, Masanobu .
SOLID-STATE ELECTRONICS, 2011, 60 (01) :7-12
[10]   Orientation-controlled Si thin films on insulating substrates by Al-induced crystallization combined with interfacial-oxide layer modulation [J].
Kurosawa, Masashi ;
Kawabata, Naoyuki ;
Sadoh, Taizoh ;
Miyao, Masanobu .
APPLIED PHYSICS LETTERS, 2009, 95 (13)