The mean residual life function of a k-out-of-n structure at the system level

被引：137

作者：

Asadi, M ^{[1
]}

Bayramoglu, I

机构：

[1] Univ Isfahan, Dept Stat, Esfahan 81744, Iran

[2] Izmir Univ Econ, Dept Math, TR-35330 Izmir, Turkey

来源：

IEEE TRANSACTIONS ON RELIABILITY | 2006年 / 55卷 / 02期

关键词：

characterization; generalized Pareto distributions; increasing failure rate distributions; mean residual lifetime; order statistics; parallel systems;

D O I：

10.1109/TR.2006.874934

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

In the study of the reliability of technical systems, k-out-of-n systems play an important role. In the present paper, We consider a k-out-of-n system consisting of n identical components with independent lifetimes having a common distribution function F. Under the condition that, at time t, all the components of the system are working, we propose a new definition for the mean residual life (MRL) function of the system, and obtain several properties of that system.

引用

页码：314 / 318

页数：5

共 12 条

[1] A note on the mean residual life function of a parallel system [J].