Analysis of the Fresnel field of a double diffraction system in the case of two amplitude diffraction gratings under partially coherent illumination

被引:13
作者
Olszak, A
Wronkowski, L
机构
[1] Warsaw University of Technology, Department of Mechatronics, 02 525 Warsaw
关键词
Fresnel diffraction; optoelectronic transducers; moire phenomenon; diffraction gratings;
D O I
10.1117/1.601433
中图分类号
O43 [光学];
学科分类号
070207 ; 0803 ;
摘要
A theoretical analysis of the Fresnel field observed behind one or two binary amplitude gratings with different transmission parameters illuminated by a beam that is in part spatially and temporally coherent is presented. A mathematical model of the moire-fringe-based optoelectronic transducer is developed. Suggestions for the design of a transducer with reduced manufacturing tolerances are presented and experimentally corroborated. (C) 1997 Society of Photo-Optical Instrumentation Engineers.
引用
收藏
页码:2149 / 2157
页数:9
相关论文
共 22 条
[1]  
[Anonymous], 1969, MOIRE FRINGES STRAIN
[2]   EFFECT OF DIFFRACTION ON THE MOIRE IMAGE .1. THEORY [J].
BARZIV, E .
JOURNAL OF THE OPTICAL SOCIETY OF AMERICA A-OPTICS IMAGE SCIENCE AND VISION, 1985, 2 (03) :371-379
[3]  
BORN M, 1976, PRINCIPLES OPTICS
[4]  
BRYNGDAHL O, 1975, J OPT SOC AM, V65, P252
[5]  
CHIANG FP, 1971, EXP MECH, V7, P296
[6]  
CHIANG FP, 1969, J ENGR MECH DIV P AS, V95, P1379
[7]   STUDY OF MOIRE OF 2 GRATINGS WITHOUT CONTACT ILLUMINATED BY A SPATIALLY PARTIALLY COHERENT FIELD [J].
DECKERS, C .
JOURNAL OF OPTICS-NOUVELLE REVUE D OPTIQUE, 1977, 8 (05) :297-300
[8]  
Ebbeni J., 1970, NOUV REV OPT APPL, V1, P333, DOI [10.1088/0029-4780/1/5/308, DOI 10.1088/0029-4780/1/5/308]
[9]   MOIRE PROFILE PREDICTION BY USING FOURIER-SERIES FORMALISM [J].
PATORSKI, K ;
YOKOZEKI, S ;
SUZUKI, T .
JAPANESE JOURNAL OF APPLIED PHYSICS, 1976, 15 (03) :443-456
[10]   THE SELF-IMAGING PHENOMENON AND ITS APPLICATIONS [J].
PATORSKI, K .
PROGRESS IN OPTICS, 1989, 27 :1-108