Advanced microelectromechanical systems-based nanomechanical testing: Beyond stress and strain measurements

被引:34
|
作者
Bhowmick, Sanjit [1 ]
Espinosa, Horacio [2 ,3 ,4 ]
Jungjohann, Katherine [5 ]
Pardoen, Thomas [6 ]
Pierron, Olivier [7 ]
机构
[1] Bruker Nano Inc, Eden Prairie, MN 55344 USA
[2] Northwestern Univ, McCormick Sch Engn & Appl Sci, Mfg & Entrepreneurship, Evanston, IL 60208 USA
[3] Northwestern Univ, McCormick Sch Engn & Appl Sci, Mech Engn, Evanston, IL 60208 USA
[4] Northwestern Univ, McCormick Sch Engn & Appl Sci, Theoret & Appl Mech TAM Program, Evanston, IL 60208 USA
[5] Ctr Integrated Nanotechnol, Albuquerque, NM USA
[6] Catholic Univ Louvain, Inst Mech Mat & Civil Engn, Louvain, Belgium
[7] Georgia Inst Technol, Woodruff Sch Mech Engn, Atlanta, GA 30332 USA
基金
美国国家科学基金会;
关键词
microelectro-mechanical (MEMS); transmission electron microscopy (TEM); fatigue; fracture; tribology; strength; CHIP TEST METHOD; FRACTURE-TOUGHNESS; CREEP-BEHAVIOR; SITU; STRENGTH; FATIGUE; MEMS; MECHANISMS; PLASTICITY; DEFORMATION;
D O I
10.1557/mrs.2019.123
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The field of in situ nanomechanics is greatly benefiting from microelectromechanical systems (MEMS) technology and integrated microscale testing machines that can measure a wide range of mechanical properties at nanometer scales, while characterizing the damage or microstructure evolution in electron microscopes. This article focuses on the latest advances in MEMS-based nanomechanical testing techniques that go beyond stress and strain measurements under typical monotonic loadings. Specifically, recent advances in MEMS testing machines now enable probing key mechanical properties of nanomaterials related to fracture, fatigue, and wear. Tensile properties can be measured without instabilities or at high strain rates, and signature parameters such as activation volume can be obtained. Opportunities for environmental in situ nanomechanics enabled by MEMS technology are also discussed.
引用
收藏
页码:487 / 493
页数:7
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