Surface-relaxation-induced giant corrugation on graphite (0001)

被引:27
作者
Kawai, Shigeki [1 ,2 ,3 ]
Kawakatsu, Hideki [1 ,2 ]
机构
[1] Univ Tokyo, Inst Ind Sci, Meguro Ku, Tokyo 1538505, Japan
[2] Japan Sci & Technol Agcy, CREST, Meguro Ku, Tokyo 1538505, Japan
[3] Univ Basel, Dept Phys, CH-4056 Basel, Switzerland
关键词
deformation; elastic constants; graphite; scanning tunnelling microscopy; ATOMIC-FORCE MICROSCOPY; SCANNING-TUNNELING-MICROSCOPY; LOW-TEMPERATURES; RESOLUTION; IMAGES; SCALE; TIP;
D O I
10.1103/PhysRevB.79.115440
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Soft graphite surface was atomically resolved by ultrasmall amplitude dynamic force microscopy operating at 5 MHz. The giant corrugation amplitude of up to 85 pm appeared due to local vertical deformations of the graphite surface. In simultaneous scanning tunneling microscopy and dynamic force microscopy, all of the symmetric C atoms were resolved with the conservative interaction in the repulsive regime. Additionally, the dissipative interaction showed a large difference of asymmetric alpha and beta site C atoms, arising from the different mechanical properties. The low stiffness of the graphite surface played a crucial role in the observations at room temperature.
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页数:5
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