Role of hybridization on the Schottky barrier height of carbon nanotube field effect transistors

被引:8
作者
Casterman, D. [1 ]
De Souza, M. M. [1 ]
Tahraoui, A. [2 ]
Durkan, C. [2 ]
Milne, W. I. [2 ]
机构
[1] Univ Sheffield, Dept Elect & Elect Engn, Sheffield S1 3JD, S Yorkshire, England
[2] Univ Cambridge, Dept Engn, Cambridge CB3 0FA, England
基金
英国工程与自然科学研究理事会;
关键词
ab initio calculations; carbon nanotubes; density functional theory; effective mass; energy gap; nanotube devices; Schottky barriers; Schottky gate field effect transistors; semiconductor device models; semiconductor materials; INITIO MOLECULAR-DYNAMICS; TOTAL-ENERGY CALCULATIONS; FAMILY BEHAVIOR; TRANSITION; PSEUDOPOTENTIALS; CONTACT; DENSITY;
D O I
10.1103/PhysRevB.79.125407
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The impact of hybridization on the Schottky barrier height (SBH) for holes at a metal/nanotube contact is investigated using ab initio density-functional theory. For small diameters, the impact of hybridization is a deviation of the SBH in comparison to that calculated using the "1/d" rule, where d is the diameter of the carbon nanotube (CNT). In the hybridization region, the SBH reduces with chiral angle, suggesting that CNTs in this region may well be suited to microelectronic applications due to small SBH and large band gaps. Hybridization also causes a difference between the effective mass of electrons and holes, supposed to be identical within the tight-binding approximation. A strongly patterned behavior of the effective mass dependent on chirality and diameter is also reported here.
引用
收藏
页数:6
相关论文
共 34 条
[1]   Leakage and performance of zero-Schottky-barrier carbon nanotube transistors [J].
Alam, K ;
Lake, RK .
JOURNAL OF APPLIED PHYSICS, 2005, 98 (06)
[2]   Dielectric scaling of a zero-Schottky-barrier, 5 nm gate, carbon nanotube transistor with source/drain underlaps [J].
Alam, Khairul ;
Lake, Roger K. .
JOURNAL OF APPLIED PHYSICS, 2006, 100 (02)
[3]   Structure-assigned optical spectra of single-walled carbon nanotubes [J].
Bachilo, SM ;
Strano, MS ;
Kittrell, C ;
Hauge, RH ;
Smalley, RE ;
Weisman, RB .
SCIENCE, 2002, 298 (5602) :2361-2366
[4]   HYBRIDIZATION EFFECTS AND METALLICITY IN SMALL RADIUS CARBON NANOTUBES [J].
BLASE, X ;
BENEDICT, LX ;
SHIRLEY, EL ;
LOUIE, SG .
PHYSICAL REVIEW LETTERS, 1994, 72 (12) :1878-1881
[5]   The role of metal-nanotube contact in the performance of carbon nanotube field-effect transistors [J].
Chen, ZH ;
Appenzeller, J ;
Knoch, J ;
Lin, YM ;
Avouris, P .
NANO LETTERS, 2005, 5 (07) :1497-1502
[6]   Electrical transport properties and field effect transistors of carbon nanotubes [J].
Dai, Hongjie ;
Javey, Ali ;
Pop, Eric ;
Mann, David ;
Kim, Woong ;
Lu, Yuerui .
NANO, 2006, 1 (01) :1-13
[7]   A numerical study of scaling issues for Schottky-Barrier carbon nanotube transistors [J].
Guo, J ;
Datta, S ;
Lundstrom, M .
IEEE TRANSACTIONS ON ELECTRON DEVICES, 2004, 51 (02) :172-177
[8]   Electrical properties and devices of large-diameter single-walled carbon nanotubes [J].
Javey, A ;
Shim, M ;
Dai, HJ .
APPLIED PHYSICS LETTERS, 2002, 80 (06) :1064-1066
[9]   Ballistic carbon nanotube field-effect transistors [J].
Javey, A ;
Guo, J ;
Wang, Q ;
Lundstrom, M ;
Dai, HJ .
NATURE, 2003, 424 (6949) :654-657
[10]   Electrostatics of coaxial Schottky-barrier nanotube field-effect transistors [J].
John, DL ;
Castro, LC ;
Clifford, J ;
Pulfrey, DL .
IEEE TRANSACTIONS ON NANOTECHNOLOGY, 2003, 2 (03) :175-180